Optical Design of Solar Extreme Ultraviolet Normal-Incidence Broadband Imaging Spectrometer with Non-Rowland Circle Mounting

Yangguang Xing; Lin Li; Jilong Peng; Shanshan Wang; Yinuo Cheng

doi:10.3788/AOS202040.2312005

Acta Optica Sinica, Volume. 40, Issue 23, 2312005(2020)

Optical Design of Solar Extreme Ultraviolet Normal-Incidence Broadband Imaging Spectrometer with Non-Rowland Circle Mounting

Yangguang Xing^1,2,3, Lin Li^1、*, Jilong Peng^2、**, Shanshan Wang^1、***, and Yinuo Cheng⁴

Author Affiliations

¹School of Optics and Photonics, Beijing Institute of Technology, Beijing 100081, China

²Beijing Institute of Spacecraft Environment Engineering, Beijing 100094, China

³National Key Laboratory of Science and Technology on Reliability and Environment Engineering, Beijing 100094, China

⁴Department of Precision Instrument, Tsinghua University, Beijing 100091, China

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Figures & Tables(19)

Fig. 1. Schematic of solar EUV normal-incidence imaging spectrometer. (a) Rowland circle mounting; (b) non-Rowland circle mounting

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Fig. 2. Schematic of aberration-corrected TVLS grating

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Fig. 3. Schematic of optical layout of solar EUV broadband imaging spectrometer. (a) Two-dimensional optical layout; (b) three-dimensional model diagram

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Fig. 4. Curve of the ruling density distribution of TVLS grating

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Fig. 5. Ray tracing results. (a)-(c) RMS spots radii change with wavelengths under different off-axis FOV; (d) RMS spots radii versus FOV in the different wavelengths

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Fig. 6. MTFs of optical system under different wavelengths. (a) λ=40 nm; (b) λ=53 nm; (c) λ=60 nm; (d) λ=73 nm

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Fig. 7. Spectral resolution of system change with wavelength. (a) 40-47 nm; (b) 53-60 nm; (c) 66-73 nm

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Fig. 8. Ray tracing module for different line-pairs spectral images

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Fig. 9. Spectrum of line pairs imaged on three CCDs. (a) CCD-1; (b) CCD-2; (c) CCD-3

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$Diffraction enclosed circle energy used to evaluate system's spatial resolution. (a) λ=43.5 nm; (b) λ=56.5 nm; (c) λ=69.5 nm$

Fig. 10. Diffraction enclosed circle energy used to evaluate system's spatial resolution. (a) λ=43.5 nm; (b) λ=56.5 nm; (c) λ=69.5 nm

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Fig. 11. Reflectance curve of SiC/Al multilayer film obtained by simulation change with wavelength

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Fig. 12. TVLS grating efficiency and CCD quantum efficiency change with wavelength. (a) Grating efficiency; (b) CCD quantum efficiency

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Fig. 13. Instrument effective area change with wavelength. (a) Proposed instrument; (b) Solar Orbiter/SPICE

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Table 1. Technical indicators of solar EUV imaging spectrometers

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Table 1. Technical indicators of solar EUV imaging spectrometers

Instrument	Wavelength /nm	SlitFOV /(')	Spectralresolution /(10^-4 nm)	Spatialresolution /(″)	Gratings	Spectralmagnification
HiRES	51-63	3	69	0.4	TULS	1.0×
Hinode /EIS	17-21 & 25-29	8.5	47&22	1.0	TULS	1.4×
SPICE	70.4-79 & 97.3-104.9	13	95&83	1.1	TVLS	5.5×
Proposeddesign	40-47 & 53-60 &66-73	18	< 30	< 0.60	TVLS	4.0×

Table 2. F_jk and its corresponding aberrations
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Table 2. F_jk and its corresponding aberrations
Term Aberration
F₁₀ and F₀₁ Basic grating equation
F₂₀ Tangential astigmatism
F₀₂ Sagittal astigmatism
F₁₁ Off-axis defocusing
F₃₀ and F₂₁ Coma
F₁₂ Slit curvature
F₄₀, F₂₂, and F₀₄ Spherical aberration

Table 3. Examples of temperature and density for diagnostic plasma line in the observed spectral region
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Table 3. Examples of temperature and density for diagnostic plasma line in the observed spectral region
Ion Wavelength /nm log T_max /K log N_e /cm^-3
Mg VI 40.331 5.63 >10
Ne V 41.620 5.67 8-10
Mg VIII 43.047/43.662 4.52 8-10
O IV 55.451 5.24 7-8.5
Si IX 69.469 6.05 >11
Mg IX 70.604 5.99 9.2-10.5
Fe XX 72.155 6.92 >10

Table 4. Technical indicators and optical element parameters for imaging spectrometer

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Table 4. Technical indicators and optical element parameters for imaging spectrometer

Specification
Anastigmatic spectralrange /nm	40-47 & 53-60 & 66-73
IFOV/[(″)×(') ]	0.54×18
Scanning FOV / (')	± 5
Spectralresolution /(10^-4 nm)	24.9-26.9
Spatial resolution /(″)	0.54
System focal length /mm	5200
Detector /μm	13.5,2048×3072
Telescope design
R_T /mm	2664
Conic	-1.33
Δ /mm	95
Spectral imaging system design
Slit size /(μm×mm)	3.2×7
1/d₀ /mm^-1	3000
m	+1 order
Grating parameter	Initial	Optimum
β	4×	3.986×
i /(°)	1.925	1.931
r_A /mm	387.000	387.325
R /mm	620.397	619.992
ρ /mm	616.216	616.673
b₂	0.0658	0.0671
Groove density /( groove·mm^-1)	3000±13
Ruling area /mm²	π×20×20
Three independent detectors design
CCD	Wavelength /nm	ψ /(°)
CCD-1	40-47	22.16
CCD-2	53-60	26.18
CCD-3	66-73	29.42

Table 5. Simulation parameters for ray tracing module in ZEMAX non-sequential mode

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Table 5. Simulation parameters for ray tracing module in ZEMAX non-sequential mode

Simulation parameters for source with two angles
X half width /mm	Y half width /mm			X half angle /(°)			Y half angle /(°)		Power /W			Rays
50	50			0.15			0.15		1			10⁹
Simulation spectral line-pairs for source with two angles
CCD-1 /nm			40 & 40.0027			43.5 & 43.5027				47 & 47.0027
CCD-2/nm			53 & 53.0026			56.5 & 56.5026				60 & 60.0026
CCD-3/nm			66 & 66.0025			69.5 & 69.5025				73 & 73.0025
Simulation parameters for CCDs
Material		X half width/mm			Y half width/mm			X /pixel			Y /pixel
Absorb		20.8			14			3072			2048

Table 6. Periodic SiC/Al multilayer film parameters
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Table 6. Periodic SiC/Al multilayer film parameters
γ /(°) d /nm τ N δ_SiC-Al /nm δ_Al-SiC /nm
88 26.4 0.31 30 2.1 0.9

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Yangguang Xing, Lin Li, Jilong Peng, Shanshan Wang, Yinuo Cheng. Optical Design of Solar Extreme Ultraviolet Normal-Incidence Broadband Imaging Spectrometer with Non-Rowland Circle Mounting[J]. Acta Optica Sinica, 2020, 40(23): 2312005

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Paper Information

Category: Instrumentation, Measurement and Metrology

Received: Jul. 7, 2020

Accepted: Aug. 28, 2020

Published Online: Dec. 1, 2020

The Author Email: Li Lin (bit421@bit.edu.cn), Peng Jilong (JL_Peng@hotmail.com), Wang Shanshan (wshan@bit.edu.cn)

DOI:10.3788/AOS202040.2312005

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology

Table 1. Technical indicators of solar EUV imaging spectrometers

Table 1. Technical indicators of solar EUV imaging spectrometers

Table 2. F_jk and its corresponding aberrations

Table 2. F_jk and its corresponding aberrations

Table 3. Examples of temperature and density for diagnostic plasma line in the observed spectral region

Table 3. Examples of temperature and density for diagnostic plasma line in the observed spectral region

Table 4. Technical indicators and optical element parameters for imaging spectrometer

Table 4. Technical indicators and optical element parameters for imaging spectrometer

Table 5. Simulation parameters for ray tracing module in ZEMAX non-sequential mode

Table 5. Simulation parameters for ray tracing module in ZEMAX non-sequential mode

Table 6. Periodic SiC/Al multilayer film parameters

Table 6. Periodic SiC/Al multilayer film parameters

Table 1. Technical indicators of solar EUV imaging spectrometers

Table 1. Technical indicators of solar EUV imaging spectrometers

Table 2. Fjk and its corresponding aberrations

Table 2. Fjk and its corresponding aberrations

Table 3. Examples of temperature and density for diagnostic plasma line in the observed spectral region

Table 3. Examples of temperature and density for diagnostic plasma line in the observed spectral region

Table 4. Technical indicators and optical element parameters for imaging spectrometer

Table 4. Technical indicators and optical element parameters for imaging spectrometer

Table 5. Simulation parameters for ray tracing module in ZEMAX non-sequential mode

Table 5. Simulation parameters for ray tracing module in ZEMAX non-sequential mode

Table 6. Periodic SiC/Al multilayer film parameters

Table 6. Periodic SiC/Al multilayer film parameters

Table 2. F_jk and its corresponding aberrations

Table 2. F_jk and its corresponding aberrations