Microelectronics, Volume. 51, Issue 2, 276(2021)

Manufacture and Teste of MEMS Grating Gyroscope

HAO Feifan1,2、*, LI Mengwei1,2,3, WANG Junqiang1,2, and JIN Li1,2
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
  • show less

    According to the working principle of MEMS grating gyroscope, the gyroscope structure was simulated and manufactured at the wafer level. The structure model of the gyroscope was established in ANSYS. The analysis results showed that the driving mode and detection mode were 7 287 Hz and 7 288 Hz respectively, and the frequency difference was 1 Hz, which indicated that the structure had high sensitivity. The MEMS grating gyroscope was successfully manufactured by sputtering, wet etching, deep reactive ion etching, and anode bonding technology. The test system was built under atmospheric pressure. The measured driving mode and detection mode of the gyroscope were 7 675 Hz and 7 703 Hz respectively, and the relative error was 5.6% compared with the simulation results, which verified the feasibility of the process.

    Tools

    Get Citation

    Copy Citation Text

    HAO Feifan, LI Mengwei, WANG Junqiang, JIN Li. Manufacture and Teste of MEMS Grating Gyroscope[J]. Microelectronics, 2021, 51(2): 276

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Save article for my favorites
    Paper Information

    Category:

    Received: Aug. 8, 2020

    Accepted: --

    Published Online: Mar. 11, 2022

    The Author Email: Feifan HAO (18334788380@163.com)

    DOI:10.13911/j.cnki.1004-3365.200361

    Topics