Infrared and Laser Engineering, Volume. 51, Issue 2, 20220022(2022)
Light beam induced current mapping to characterize damage characteristics of silicon solar cell irradiated by continuous-wave laser
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Jian Lu, Zhijian Xie, Hongchao Zhang. Light beam induced current mapping to characterize damage characteristics of silicon solar cell irradiated by continuous-wave laser[J]. Infrared and Laser Engineering, 2022, 51(2): 20220022
Category: Special issue-Laser technology and its application
Received: Jan. 6, 2022
Accepted: --
Published Online: Mar. 21, 2022
The Author Email: Zhijian Xie (xiezhijian@njust.edu.cn)