[1] [1] M. M. Hawkeye and M. J. Brett, J. Vac. Sci. Technol. A 25, 1317 (2007).

[2] [2] J. J. Steele and M. J. Brett, J. Mater. Sci. Mater. Electron. 18, 367 (2007).

[3] [3] N. O. Young and J. Kowal, Nature 183, 104 (1959).

[4] [4] K. Robbie, M. J. Brett, and A. Lakhtakia, Nature 384, 616 (1996).

[5] [5] D. P. Smetaniuk, M. T. Taschuk, and M. J. Brett, IEEE Sen. J. 11, 1713 (2011).

[6] [6] W. Zhang, S. Kim, N. Ganesh, I. D. Block, P. C. Mathias, H.-Y. Wu, and B. T. Cunningham, J. Vac. Sci. Technol. A 28, 996 (2010).

[7] [7] L. Gonzalez-Garcia, I. Gonzalez-Valls, M. LiraCantu, A. Barranco, and A. R. Gonzalez-Elipe, Energy Environ. Sci. 4, 3426 (2011).

[8] [8] I. Hodgkinson, Q. H. Wu, B. Knight, A. Lakhtakia, and K. Robbie, Appl. Opt. 39, 642 (2000).

[9] [9] L. O. Palomares and J. A. Reyes, Appl. Phys. Lett. 93, 181909 (2008).

[10] [10] Y. J. Park, K. M. A. Sobahan, and C. K. Hwangbo, Opt. Express 16, 5186 (2008).

[11] [11] A. Lakhtakia, M. W. McCall, J. A. Sherwin, Q. H. Wu, and I. J. Hodgkinson, Opt. Commun. 194, 33 (2001).

[12] [12] J. Tang, P. Gu, X. Liu, and H. Li, Modern Optical Thin Film Technology (in Chinese) (Zhejiang University Press, Hangzhou, 2006).

[13] [13] T. Karabacak, J. P. Singh, Y.-P. Zhao, G.-C. Wang, and T.-M. Lu, Phys. Rev. B 68, 125408 (2003).

[14] [14] M. T. Taschuk, K. M. Krause, J. J. Steele, and M. A. Summers, J. Vac. Sci. Technol. B 27, 2106(2009).

[15] [15] A. C. van Popta, M. J. Brett, and J. C. Sit, J. Appl. Phys. 98, 083517 (2005).

[16] [16] M. Suzuki, T. Ito, and Y. Taga, J. J. Appl. Phys. Pt. 2 40, L398 (2001).

[17] [17] A. Lakhtakia and M. W. Horn, Optik 114, 556 (2003).