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Laser & Optoelectronics Progress, Volume. 54, Issue 5, 51203(2017)

Fast and Stable White Light Interferometry

Dong Yifan*, Wan Xinjun, Meng Han, and Xie Shuping
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    Dong Yifan, Wan Xinjun, Meng Han, Xie Shuping. Fast and Stable White Light Interferometry[J]. Laser & Optoelectronics Progress, 2017, 54(5): 51203

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Dec. 9, 2016

    Accepted: --

    Published Online: May. 3, 2017

    The Author Email: Dong Yifan (dyf618@163.com)

    DOI:10.3788/lop54.051203

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology