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Acta Optica Sinica, Volume. 26, Issue 1, 39(2006)

Full Automatic Phase Unwrapping Method Based on Projected Double Spatial Frequency Fringes

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    [5] [5] William W. Macy, Jr. Two-dimensional fringe-pattern analysis[J]. Appl. Opt., 1983, 22(23): 3898～3901

    [6] [6] Catherine E. Towers， David P. Towers, Julian D. C. Jones. Time efficient Chinese remainder theorem algorithm for full-field fringe phase analysis in multi-wavelength interferometry[J]. Opt. Exp., 2004, 12(6): 1136～1147

    CLP Journals

    [1] Zhang Ting, Lu Yuangang, Zhang Xuping. The Application of Tabu Search on Minimum Discontinuity Phase Unwrapping Algorithm[J]. Acta Optica Sinica, 2009, 29(8): 2169

    [2] Zhang Ting, Lu Yuangang, Zhang Xuping. Minimum-Discontinuity Phase Unwrapping Algorithm Based on Edge Detection[J]. Acta Optica Sinica, 2009, 29(1): 180

    [3] Ji Hongbin, Zhang Huibo, Dai Shijie, Wang Zhiping. Binary spatiotemporal encoded method used for uneven fringes phase unwrapping[J]. Infrared and Laser Engineering, 2017, 46(4): 417004

    [4] Peng Lu, Changku Sun, Peng Wang. Fringe Projection Phase-to-Height Mapping Model and Its Calibration Method[J]. Acta Optica Sinica, 2018, 38(2): 0212004

    [5] Chen Songlin, Zhao Jibin, Xia Renbo. Improvement of the Phase Unwrapping Method Based on Multi-Frequency Heterodyne Principle[J]. Acta Optica Sinica, 2016, 36(4): 412004

    [6] Zhu Yongjian, Pan Weiqing, Liu Hongzhan, Yin Shaohui. New Composite Quality Map for Phase Reconstructing Algorithm in Optical Measurement[J]. Acta Optica Sinica, 2009, 29(s1): 1

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    [in Chinese], [in Chinese]. Full Automatic Phase Unwrapping Method Based on Projected Double Spatial Frequency Fringes[J]. Acta Optica Sinica, 2006, 26(1): 39

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    Paper Information

    Category: Imaging Systems

    Received: Jan. 13, 2005

    Accepted: --

    Published Online: Apr. 20, 2006

    The Author Email: (zhihuilei@hotmail.com)

    DOI:

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology