Opto-Electronic Engineering, Volume. 40, Issue 5, 120(2013)

Extension Characteristics of the Depth of Field for Microscopic System

ZOU Shuang1,2、*, XU Zhongbao1,2, and Lü Qinghua3
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
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    References(14)

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    [5] [5] ZHAI Zhongsheng, DING Shanting, Lü Qinghua, et al. Extended depth of field through an axicon [J]. Journal of Modern Optics(S0950-0340), 2009, 6(11): 1304-1308.

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    [9] [9] YANG Qingguo, LIU Liren, SUN Jianfeng, et al. Optimized phase pupil masks for extended depth of field [J]. Optics Communications(S0030-4018), 2007, 272(1): 56-66.

    [10] [10] ZHAO Tingyu, CHEN Yanping, ZHANG Wenzi, et al. Focal depth extending using rotational symmetric pupil masks [J]. Chinese Optics Letters(S1671-7694), 5(2): 71-73.

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    CLP Journals

    [1] JI Xiao-qiang, CHENG Jie-zhang, LI Qi, GONG Ping, GUO Rui-juan, YU Yuan-hua. Optical Microscopic Imaging and Image Processing for Cell Factories[J]. Acta Photonica Sinica, 2015, 44(7): 711004

    [2] CHEN Guangwei, AN Yongquan, WANG Zhibin, CHEN Youhua, ZHANG Minjuan, WANG Guoliang, YANG Xiao. Self Tracking Technology of Photoelastic Modulation Frequency[J]. Opto-Electronic Engineering, 2015, 42(10): 21

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    ZOU Shuang, XU Zhongbao, Lü Qinghua. Extension Characteristics of the Depth of Field for Microscopic System[J]. Opto-Electronic Engineering, 2013, 40(5): 120

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    Paper Information

    Received: Nov. 27, 2012

    Accepted: --

    Published Online: May. 24, 2013

    The Author Email: Shuang ZOU (195264177@qq.com)

    DOI:10.3969/j.issn.1003-501x.2013.05.017

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