[1] [1] E. F. Schubert and J. K. Kim, Science 308, 1274 (2005).

[2] [2] C.-C. Sun, C.-Y. Chen, C.-C. Chen, C.-Y. Chiu, Y.-N. Peng, Y.-H. Wang, T.-H. Yang, T.-Y. Chung, and C.-Y. Chung, Opt. Express 20, 6622 (2012).

[3] [3] S. Ching-Cherng, I. Moreno, L. Yi-Chien, C. Bo-Chun, and C. Wei-Ting, Opt. Express 20, A75 (2012).

[4] [4] K. H. Lee, S. H. Park, H. S. Yoon, Y.-I. Kim, H. G. Jang, and W. B. Im, Opt. Express 20, 6248 (2012).

[5] [5] Y. Tanaka, T. Komine, S. Haruyama, and M. Nakagawa, IEICE Trans. Commun. E86-B, 2440 (2003).

[6] [6] D. O’Brien, H. L. Minh, L. Zeng, G. Faulkner, K. Lee, D. Jung, Y. Oh, and E. T. Won, Proc. SPIE 7091, 709106(2008).

[7] [7] Z. Wang, C. Yu, W. Zhong, J. Chen, and W. Chen, Opt. Express 20, 4564 (2011).

[8] [8] T. Komiyama, K. Kobayashi, K. Watanabe, T. Ohkubo, and Y. Kurihara, in Proceedings of 50th Annual Conference on Society of Instrument and Control Engineers 1926 (2011).

[9] [9] R. G. Gallager, Low-Density Parity-Check Codes (MA: MIT. Press, Cambridge, 1963).

[10] [10] D. J. C. MacKay, IEEE Trans. Inform. Theory 45, 399(1999).

[11] [11] T. Richardson, Modern Coding Theory (Cambridge University Press, Cambridge, 2008).

[12] [12] L. Kwonhyung, P. Hyuncheol, and J. R. Barry, IEEE Commun. Lett. 15, 217 (2011).

[13] [13] T. Javornik, I. Jelovcan, S. S. Muhammad, and G. Kandus, AEU Int. J. Electron. Commun. 63, 595 (2009).