Chinese Optics Letters, Volume. 7, Issue 5, 05446(2009)
Measurement of absolute phase shift on reflection of thin films using white-light spectral interferometry
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Hui Xue, Weidong Shen, Peifu Gu, Zhenyue Luo, Yueguang Zhang, Xu Liu, "Measurement of absolute phase shift on reflection of thin films using white-light spectral interferometry," Chin. Opt. Lett. 7, 05446 (2009)
Paper Information
Received: Jul. 17, 2008
Accepted: --
Published Online: May. 22, 2009
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