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Laser & Optoelectronics Progress, Volume. 58, Issue 8, 0822001(2021)

Simulation Research on Illumination Scheme for Bottom Defect Detection of Metal Barrel

Yongshun Qu*, Guiying Yu, Baowu Zhang**, Meidan Zhao, and Ruijie Lin
Author Affiliations
  • College of Metrology and Measurement Engineering, China Jiliang University, Hangzhou, Zhejiang 310018, China
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    Figures&Tables (9)
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    Figures & Tables(9)
    Optical path diagram for endoscopic non-positive illumination

    Fig. 1. Optical path diagram for endoscopic non-positive illumination

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    Geometric relationship of bidirectional scattering distribution function

    Fig. 2. Geometric relationship of bidirectional scattering distribution function

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    Distribution map of target surface test areas

    Fig. 3. Distribution map of target surface test areas

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    Structural model of bottom illumination system of metal barrel

    Fig. 4. Structural model of bottom illumination system of metal barrel

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    Model of image acquisition system

    Fig. 5. Model of image acquisition system

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    Illuminance distributions and illuminance curves of target plane illuminated at different positions. (a1) (a2) 800 mm; (b1) (b2) 750 mm; (c1) (c2) 700 mm; (d1) (d2) 650 mm; (e1) (e2) 600 mm; (f1) (f2) 550 mm

    Fig. 6. Illuminance distributions and illuminance curves of target plane illuminated at different positions. (a1) (a2) 800 mm; (b1) (b2) 750 mm; (c1) (c2) 700 mm; (d1) (d2) 650 mm; (e1) (e2) 600 mm; (f1) (f2) 550 mm

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    Bottom images of barrel illuminated at different positions in verification experiment and illumination compensation map. (a) 800 mm; (b) 750 mm; (c) 700 mm; (d) 650 mm; (e) illumination compensation map

    Fig. 7. Bottom images of barrel illuminated at different positions in verification experiment and illumination compensation map. (a) 800 mm; (b) 750 mm; (c) 700 mm; (d) 650 mm; (e) illumination compensation map

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    Defect recognition for each illumination scheme

    Fig. 8. Defect recognition for each illumination scheme

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    • Table 1. Illuminance uniformity of object surface illuminated at different positions

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      Table 1. Illuminance uniformity of object surface illuminated at different positions

      Serial numberDistance/ mmMinimum illuminance /luxAverage illuminance 1 /luxAverage illuminance 2 /luxSubject area uniformity /%Overall uniformity /%
      1550105.08113.12140.1292.8974.99
      2600102.11110.13133.2292.7276.65
      365099.13107.55132.8492.1774.62
      470098.46106.51130.7892.4475.29
      575098.38107.12129.9791.8475.69
      680098.03106.13129.3292.3775.80
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    Yongshun Qu, Guiying Yu, Baowu Zhang, Meidan Zhao, Ruijie Lin. Simulation Research on Illumination Scheme for Bottom Defect Detection of Metal Barrel[J]. Laser & Optoelectronics Progress, 2021, 58(8): 0822001

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    Paper Information

    Category: Optical Design and Fabrication

    Received: Jul. 27, 2020

    Accepted: Sep. 22, 2020

    Published Online: Apr. 22, 2021

    The Author Email: Yongshun Qu (125028120@qq.com), Baowu Zhang (zhangbaowu@126.com)

    DOI:10.3788/LOP202158.0822001

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology