Optical Surface Defect Stitching Method Based on Sub-Aperture Feature Dataset

Fig. 5. Matching stitching result images of sub-aperture area. (a) Stitching result images of the direct stitching method; (b) stitching result images of proposed method

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Fig. 6. Stitching result images of full aperture. (a) Full aperture stitching image based on template matching method; (b) full aperture stitching image based on feature dataset

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Fig. 7. Defect distribution image corresponding to full aperture image based on feature dataset stitching

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Fig. 8. Defect detection results of full aperture image. (a) Detection result of full aperture image based on template matching method; (b) detection result of full aperture image of proposed method

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Table 1. Data information contained in the sub-aperture feature dataset

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Table 1. Data information contained in the sub-aperture feature dataset

Serial number	Sub-aperture number	Scanning steps	Number of defects	Sparse matrix compression data	Overlapping area data
1	1	[0, 0]	10	1×1 cell	1×7 cell
2	2	[1, 0]	7	1×1 cell	1×7 cell
3	3	[2, 0]	9	1×1 cell	1×7 cell
4	4	[3, 0]	7	1×1 cell	1×7 cell
5	5	[3, 1]	7	1×1 cell	1×7 cell
6	6	[2, 1]	5	1×1 cell	1×7 cell
7	7	[1, 1]	7	1×1 cell	1×7 cell
8	8	[0, 1]	7	1×1 cell	1×7 cell
9	9	[0, 2]	2	1×1 cell	1×7 cell
10	10	[1, 2]	4	1×1 cell	1×7 cell
11	11	[2, 2]	2	1×1 cell	1×7 cell
12	12	[3, 2]	3	1×1 cell	1×7 cell
13	13	[3, 3]	6	1×1 cell	1×7 cell
14	14	[2, 3]	6	1×1 cell	1×7 cell
15	15	[1, 3]	2	1×1 cell	1×7 cell
16	16	[0, 3]	5	1×1 cell	1×7 cell

Table 2. Data contained in the sub-aperture 10 overlapping area data cell

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Table 2. Data contained in the sub-aperture 10 overlapping area data cell

Overlapping area number	Number of defects	Type of defect	Defect center of mass	Hu invariant moment	Sparse matrix compression data	Relative position
10_s	2	[0; 0]	2×1 cell	2×1 cell	1×1 cell	2×1 cell
10_x	0	‒	‒	‒	‒	‒
10_y	0	‒	‒	‒	‒	‒
10_z	1	[0]	1×1 cell	1×1 cell	1×1 cell	1×1 cell

Table 3. Calculated offsets between overlapping areas of matched sub-apertures

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Table 3. Calculated offsets between overlapping areas of matched sub-apertures

Serialnumber	method Results of proposed		Results of the templatematching method		Calculated deviation inX direction /pixel	Calculated deviation inY direction /pixel
Serialnumber	$Δ x$ /pixel	$Δ y$ /pixel	$Δ x$ /pixel	$Δ y$ /pixel	Calculated deviation inX direction /pixel	Calculated deviation inY direction /pixel
1	-2.4	-3.5	-2.7	-4.1	0.3	0.6
2	-2.3	-4.6	-2.5	-4.5	0.2	-0.1
3	0.6	-5.3	0.5	-4.5	0.1	-0.8
4	5.2	4.3	4.9	3.9	0.3	0.4
5	5.3	7.8	4.5	7.5	0.8	0.3
6	4.7	3.2	4.5	2.5	0.2	0.7
7	5.0	5.6	4.9	4.9	0.1	0.7
8	4.9	3.6	4.5	3.5	0.4	0.1
9	5.6	6.7	5.1	6.5	0.5	0.2

Table 4. Detection results of scratch defects

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Table 4. Detection results of scratch defects

Defect number	Detection results of proposed method		Detection results of template matching method		Calculation deviation of length /mm
Defect number	Length /mm	Area /mm²	Length /mm	Area /mm²	Calculation deviation of length /mm
25	7.5746	0.4543	7.5704	0.4540	0.0042
31	6.3213	0.4081	6.3262	0.4083	-0.0049

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Yingru Wang, Hongjun Wang, Xueliang Zhu, Bingcai Liu, Xin Yue, Ailing Tian. Optical Surface Defect Stitching Method Based on Sub-Aperture Feature Dataset[J]. Chinese Journal of Lasers, 2024, 51(13): 1304004

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Paper Information

Category: Measurement and metrology

Received: Aug. 30, 2023

Accepted: Oct. 9, 2023

Published Online: May. 16, 2024

The Author Email: Hongjun Wang (whj0253@sina.com)

DOI:10.3788/CJL231154

CSTR:32183.14.CJL231154

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology