Journal of Terahertz Science and Electronic Information Technology , Volume. 23, Issue 3, 214(2025)

Terahertz channel propagation and physical layer security characteristics in corner scenarios

SU Yue1,2, LI Da1, LIU Jiacheng1, CUI Jiayuan1, SUN Houjun1,2,3, and MA Jianjun1,2,3、*
Author Affiliations
  • 1School of Integrated Circuits and Electronics, Beijing 100081, China
  • 2Tangshan Research Institute, Beijing Institute of Technology, Tangshan Hebei 063099, China
  • 3Beijing Key Laboratory of Millimeter and Terahertz Wave Technology, Beijing Institute of Technology, Beijing 100081, China
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    With the development of 6G networks, in-depth research on the propagation characteristics of terahertz(THz) channels in urban environments is crucial for designing efficient, reliable, and secure communication systems. The impact of different types of building corners(including acute, right, obtuse, and curved angles) on the transmission of THz channels and their physical layer security are systematically investigated through a combination of theoretical analysis, numerical simulation, and experimental measurement. The experiments are conducted by using a THz channel measurement system at three frequencies: 140 GHz, 225 GHz, and 320 GHz. Theoretical analysis is performed by using numerical simulations and knife-edge diffraction models. The research findings reveal the effects of corner structures on the propagation of THz waves, including diffraction and reflection phenomena, as well as the impact of frequency variations on these phenomena. This work provides theoretical guidance for the deployment of THz communication systems in urban environments.

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    SU Yue, LI Da, LIU Jiacheng, CUI Jiayuan, SUN Houjun, MA Jianjun. Terahertz channel propagation and physical layer security characteristics in corner scenarios[J]. Journal of Terahertz Science and Electronic Information Technology , 2025, 23(3): 214

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    Paper Information

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    Received: Sep. 2, 2024

    Accepted: Jun. 5, 2025

    Published Online: Jun. 5, 2025

    The Author Email: MA Jianjun (jianjun_ma@bit.edu.cn)

    DOI:10.11805/tkyda2024523

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