Acta Optica Sinica, Volume. 20, Issue 1, 142(2000)
Soft X-Ray Microscopy of Wet Samples in Helium Environment
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[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Soft X-Ray Microscopy of Wet Samples in Helium Environment[J]. Acta Optica Sinica, 2000, 20(1): 142