<trans-title xml:lang="en">Nd:YLF Crystal Growth: Raw Materials Preparation by Melting Method and Property</trans-title>

Kaixuan ZHAO; Wenpeng LIU; Shoujun DING; Renqin DOU; Jianqiao LUO; Jinyun GAO; Guihua SUN; Hao REN; Qingli ZHANG

doi:10.15541/jim20240456

Journal of Inorganic Materials, Volume. 40, Issue 5, 529(2025)

Nd:YLF Crystal Growth: Raw Materials Preparation by Melting Method and Property

Kaixuan ZHAO^1,2, Wenpeng LIU^2、*, Shoujun DING³, Renqin DOU², Jianqiao LUO², Jinyun GAO², Guihua SUN², Hao REN⁴, and Qingli ZHANG²

Author Affiliations

¹1. Institutes of Physical Science and Information Technology, Anhui University, Hefei 230601, China

²2. Anhui Provincial Key Laboratory of Photonic Devices and Materials, Anhui Institute of Optics and Fine Mechanics, Hefei Institutes of Physical Science, Chinese Academy of Sciences, Hefei 230031, China

³3. School of Microelectronics and Data Science, Anhui University of Technology, Maanshan 243032, China

⁴4. National Laboratory of Solid State Microstructure, Department of Materials Science and Engineering, Nanjing University, Nanjing 210093, China

show less

Abstract Get PDF(in Chinese)

Figures & Tables(12)

1. Schematic diagram of raw material melting device

Download full size

View in Article

2. Polycrystalline material prepared by melting method

Download full size

View in Article

3. Nd:YLF crystals grown by Czochralski method

Download full size

View in Article

4. XRD pattern of polycrystalline material prepared by melting method

Download full size

View in Article

5. XRD pattern of whiteness among crystal grown with mixed component raw materials

Download full size

View in Article

6. XRC of Nd:YLF crystal

Download full size

View in Article

7. Rietveld fitting XRD patterns of Nd:YLF crystal

Download full size

View in Article

8. Transmission spectra of Nd:YLF crystal at room temperature

Download full size

View in Article

9. Emission spectrum of Nd:YLF crystal excited by 808 nm

Download full size

View in Article

10. Fluorescent decay curve of Nd:YLF crystal at 1047 nm

Download full size

View in Article

Table 1. Structural parameters of Nd:YLF crystal obtained by Rietveld refinement method

View table

View in Article

Table 1. Structural parameters of Nd:YLF crystal obtained by Rietveld refinement method

Element	X	Y	Z	Occupancy	Uiso
Li	0	0.25000	0.12500	0.25000	0.20666
Y	0.50000	0.75000	0.12500	0.24750	0
Nd	0.50000	0.75000	0.12500	0.00250	0
F	0.27376	0.09431	0.04622	1.00000	0
Lattice parameter		a=b=0.51696 nm, c=1.07412 nm, α=β=γ=90°
R factor		R_p=6.39%, R_wp=8.31%

Table 2. Element contents of Nd:YLF crystal tested by LA-ICP-MS method
View table
View in Article
Table 2. Element contents of Nd:YLF crystal tested by LA-ICP-MS method
Sample Mass fraction/%
Nd Y Li
Sample 1 1.7659 88.8208 7.3685
Sample 2 1.7726 89.8067 7.5738
Sample 3 1.7939 88.4968 7.9348
Average 1.7775 89.0414 7.6257

Tools

Get Citation

Copy Citation Text

Kaixuan ZHAO, Wenpeng LIU, Shoujun DING, Renqin DOU, Jianqiao LUO, Jinyun GAO, Guihua SUN, Hao REN, Qingli ZHANG. Nd:YLF Crystal Growth: Raw Materials Preparation by Melting Method and Property[J]. Journal of Inorganic Materials, 2025, 40(5): 529

Download Citation

EndNote(RIS)BibTex Plain Text

Set citation alerts for article

Save article for my favorites