[1] [1] M. Zavelani-Rossi, G. Cerullo, S. De Silvestri L. Gallmann, N. Matuschek, G. Steinmeyer, U. Keller, G. Angelow, V. Scheuer, and T. Tschudi, Opt. Lett. 26, 1155 (2001).

[2] [2] I. D. Jung, F. X. Kartner, N. Matuschek D. H. Sutter, F. Morier, F. Morier-Genound, G. Zhang, U. Keller, V. Scheuer, M. Tilsch, and T. Tschudi, Opt. Lett. 22, 1009 (1997).

[3] [3] P. C. Wagenblast, U. Morgner, F. Grawert, F. Grawert, T. R. Schibli, F. X. Kartner, V. Scheuer, G. Angelow, and M. J. Lederer, Opt. Lett. 27, 1726 (2002).

[4] [4] A. Baltuska, Z. Wei, M. S. Pshenichnikov, D. A. Wiersma, and R. Szipocs, Appl. Phys. B 65, 175 (1997).

[5] [5] R. Szipocs, K. Ferencz, Ch. Spielmann, and F. Krausz, Opt. Lett. 19, 201 (1994).

[6] [6] R. Szipocs and A. Kohazi-Kis, Appl. Phys. B 65, 115 (1997).

[7] [7] N. Matuschek, F. X. Kartner, and U. Keller, IEEE J. Sel. Quantum Electron. 4, 197 (1998).

[8] [8] G. Steinmeyer, Opt. Exp. 11, 2385 (2003).

[9] [9] R. Szipocs, A. Kohazi-Kis, S. Lako P. Apai, A. P. Kovacs, G. Debell, L. Mott, A. W. Louderback, A. V. Tikhonravov, and M. K. Trubetskov, Appl. Phys. B 70, S51 (2000).

[10] [10] B. Golubovic, R. R. Austin, M. K. Steiner-Shepard, M. K. Reed, Scott A. Diddams, D. J. Jones, and Amelia G. Van Engen, Opt. Lett. 25, 275 (2000).

[11] [11] J. Kuhl and J. Heppner, IEEE Trans. Qunatum Electron. 22, 182 (1986).

[12] [12] J. A. Dobrowolski and D. Lowe, Appl. Opt. 17, 3039 (1978).

[13] [13] G. Tempea, F. Krausz, Ch. Spielmann, and K. Ferencz, IEEE J. Sel. Top. Quantum Electron. 4, 193 (1998).

[14] [14] TFCalc: thin film design software for windows, V3.5. Http://www.sspectra.com.

[15] [15] C. Y. Liao, J. D. Shao, and Z. X. Fan, in Proceedings of the 5th International Conference on Thin Film Physics and Application (TFPA2004) (2004).

[16] [16] H. Sun, Z. G. Zhang, L. Chai, J. S. Zhao, J. M. Dai, Q. R. Xing, and C. Y. Wang, Acta Opt. Sin. (in Chinese) 21, 1384 (2001).