[1] [1] Kazuya Yonemoto. CCD/CMOS Image Sensor no Kiso to Ouyou [M]. Beijing: Science Press, 2006.

[2] [2] Gao Liuzheng, Shao Zhengzheng, Zhu Zhiwu, et al.. Thermal damage mechanism on CCD detector irradiated by pulsed laser [J]. Chinese J Lasers, 2013, 40(s1): s103001.

[3] [3] Chin-Tang San, Horng-Sen Fu. Transient response of MOS capacitors under localized photoexcitation [J]. IEEE Trans Electron Devices, 1974, 21(3): 202-209.

[4] [4] Xu Xiaojun, Zeng Jiaolong, Lu Qisheng, et al.. Study on influence to the quality of array CCD camera′s image formation under irradiation of CW YAG laser [J]. Infrared and Laser Engineering, 1999, 28(1): 36-39.

[5] [5] Wang Shiyong. Study on Laser- induced CCD Detector Vulnerability and Survivability and Fussy Synthetic Evaluation on CCD Jamming Effects [D]. Changchun: Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, 2002.

[6] [6] Chen Dezhang, Qing Guangbi, Zhang Chengquan, et al.. Saturated effect of CCD sensor resulted from laser illumination [J]. Laser Technology, 1997, 21(3): 146-148.

[7] [7] Guo Shaofeng, Cheng Xiang′ai, Fu Xiquan, et al.. Failure of array CCD irradiated by high-repetitive femto-second laser [J]. High Power Laser and Particle Beams, 2007, 19(11): 1783-1786.

[8] [8] Zhang Zhen. Laser-Induced Dazzling Phenomena in Visible Light CCD and Their Mechanism [D]. Changsha: National University of Defense Technology, 2010.

[9] [9] Zhang Zhen, Zhou Menglian, Zhang Jianmin, et al.. Entirely saturated unilateral smear of laser spot in CCD [J]. High Power Laser and Particle Beams, 2013, 25(6): 1351-1353.

[10] [10] Lei Wei, Wang Haiyan, Niu Chong. Study on CCD detector′s saturation irradiated by pulse laser [J]. Electronics Optics & Control, 2010, 17(9): 65-68.

[11] [11] Lin Junyang, Shu Rong, Huang Genghua, et al.. Study on threshold of laser damage to CCD and CMOS image sensors [J]. Journal of Infared and Millimeter Waves, 2008, 27(6): 475-478.

[12] [12] Yu Da, Zhou Huaide, Long Kehui, et al.. Screening and testing method for area CCD [J]. Chinese J Lasers, 2013, 40(7): 0708001.

[13] [13] Ma Jun, Xiao Xizhong, Lang Junwei, et al.. Study on selection of CCD detector of space-borne hyper-spectral imager [J]. Acta Optica Sinica, 2014, 34(10): 1011001.

[14] [14] TRUESENSE Imaging. KAI- 1020 image sensor, device performance specification[EB/OL]. (2012-06-22)[2013-01-04]. http://www.truesenseimaging.com/all/download/file fid=8.27.

[15] [15] International Organization for Standardization. 1SO/DIS 11145 Optics and photonics—Lasers and laser- related equipment—Vocabulary and Symbols 1SO/DIS 11145[S]. 2006.

[16] [16] Wang Yanping, Wang Qianqian, Ma Chong. Factors affecting the accurate measurement of laser beam width with CCD camera [J]. Chinese J Lasers, 2014, 41(2): 0208002.

[17] [17] TRUESENSE Imaging. KAI-1010 image sensor, device performance specification [EB/OL]. (2012-07-13)[2013-01-04]. http://www.truesenseimaging.com/all/download/file fid=8.27.

[18] [18] TRUESENSE Imaging. KAI-01050 image sensor, device performance specification [EB/OL]. (2012-11-16)[2013-01-04]. http://www.truesenseimaging.com/all/download/file fid=8.27.

[19] [19] Luo Qun. Study of Disturb Effect to Array CCD Detectors Irradiated by Broadband Source [D]. Changsha: National University of Defense Technology, 2008.

[20] [20] Sun Jinqiu, Zhou Jun. A novel method for smearing intensity estimation and elimination [C]. LNCs2012, 2012, 7202: 466- 472

          Springer Berlin Heidelberg, 2012: 7202, 466-472.

[21] [21] University CCD. Blooming vs. Anti-Blooming [EB/OL]. (2014-08-27) [2014-10-27]. http://www.ccd.com/ccd102.html.

[22] [22] A Tanabe, Y Kudoh, K Kawakami, et al.. Dynamic range improvement by narrow-channel effect suppression and smear reduction technologies in small pixel IT-CCD image sensors [J]. IEEE Trans Electron Devices. 2000, 47(9): 1700-1706.