Acta Optica Sinica, Volume. 21, Issue 10, 1239(2001)

A New 3-D Measurement System Based on Projection Moiré

[in Chinese]1, [in Chinese]2, and [in Chinese]1
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    References(5)

    [1] [1] Lenung K M, Wabg W N. Deformation measurement of surface mount assembly under power cycling using optical interferometry. Proc. SPIE-The International Society for Optical Engineering, 1996, 2888(6-7):2~4

    [4] [4] Pirodda L. Shadow and projection Moiré techniques for absolute or relative mapping of surface sahpes. Opt. Engng., 1982, 21(4):640~649

    [5] [5] Zwemer D, Hassel P, Mazeika W et al.. Moiré measurements. Aufbereitungs-Technik/Mineral Proc., 1997, 38(4):42~46

    [6] [6] Han B, Guo Yifan, Choi H C. Out-of-plane displacement of printed circuit board by shadow Moiré with variable sensitivity. American Society of Mechanical Engineers, EEP, 1993, 4(1):179~185

    [8] [8] Andresen K, Klassen D. Phase shift method applied to cross grating Moiré measurement. Optics and Laser in Engineering, 1986/1987,7(1):101~114

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    [in Chinese], [in Chinese], [in Chinese]. A New 3-D Measurement System Based on Projection Moiré[J]. Acta Optica Sinica, 2001, 21(10): 1239

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Apr. 24, 2000

    Accepted: --

    Published Online: Aug. 10, 2006

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    DOI:

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