Advanced Photonics, Volume. 6, Issue 5, 056006(2024)
Nested deep transfer learning for modeling of multilayer thin films
Fig. 1. (a) Schematic illustrating the principle of nested transfer. Left to right: Weights from the previous model are taken after training (box with dashed lines) and used for initialization of the weights of the next model (solid-colored lines between neurons), as the complexity of the output gradually increases. (b) Diagram of a multilayer thin-film structure. The structure has a choice of any of four materials at each layer, with the constraint that no two neighboring layers are the same material. (c) Architecture of the mixed convolutional MDN used for the inverse design. There are initial pairs of convolutional and max pooling layers leading to fully connected layers. The output is split into categorical channels predicting the material choice at each layer and a final MDN channel representing probability distributions of the layer thicknesses.
Fig. 2. (a) Diagram of a bidirectional RNN used for the forward model. (b) Training curves for nested transfer forward prediction for thin-film structures of increasing complexity (see legends), up to 30 layers. (c) Comparison of requested ground-truth spectrum (blue) and the spectrum predicted by the forward model (orange) for a randomly chosen case in the test data set.
Fig. 3. (a) Training curves for nested transfer inverse design up to 10 layers. The categorical loss (left panel) refers to the outputs representing the material choices at each layer, while the continuous loss (right panel) refers to the negative log likelihood for the MDN predicting the thickness of each layer. (b) Comparison of requested ground-truth spectrum (blue) and the design suggested by the model for a randomly chosen case in the test data set without postprocessing. The model-suggested design is [
Fig. 4. (a) Diagram of thin-film structure used for selective thermal emission. (b) Comparison between requested ground-truth spectrum and spectrum produced by model suggested design for an arbitrary test data set sample. The model-suggested design is [
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Rohit Unni, Kan Yao, Yuebing Zheng, "Nested deep transfer learning for modeling of multilayer thin films," Adv. Photon. 6, 056006 (2024)
Category: Research Articles
Received: Mar. 31, 2024
Accepted: Sep. 11, 2024
Posted: Sep. 12, 2024
Published Online: Oct. 24, 2024
The Author Email: Zheng Yuebing (zheng@austin.utexas.edu)