Rotation-invariant texture analysis using Radon and Fourier transforms

Songshan Xiao; Yongxing Wu

Chinese Optics Letters, Volume. 5, Issue 9, 513(2007)

Songshan Xiao^* and Yongxing Wu

Author Affiliations

College of Precision Instruments and Opto-Electronics Engineering, Tianjin University, Tianjin 300072

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References(8)

[1] [1] J. Zhang and T. Tan, Pattern Recognit. 35, 735 (2002).

[2] [2] R. Porter and N. Canagarajah, IEEE Proc. Vis. Image Signal Process. 144, 180 (1997).

[3] [3] K. Jafari-Khouzani and H. Soltanian-Zadeh, IEEE Trans. Image Process. 14, 783 (2005).

[4] [4] G. M. Haley and B. S. Manjunath, in Proc. IEEE Int. Conf. Image Processing 262 (1995).

[5] [5] H. Liu and Y. Mo, Acta Opt. Sin. (in Chinese) 19, 1406 (1999).

[6] [6] R. C. Gonzalez and R. E. Woods, Digital Image Processing (in Chinese) Q. Ruan and Y. Ruan (trans.) (Publishing House of Electronics Industry, Beijing, 2003) pp.119-123.

[7] [7] J. Wang, P. Neskovic, and L. N. Cooper, Pattern Recognit. 39, 417 (2006).

[8] [8] P. Brodatz, Texture: A Photographic Album for Artists and Designers (Dover, New York, 1966).

CLP Journals

[1] Jianxin Pang, Rong Zhang, Hui Zhang, Xuan Huang, Zhengkai Liu, "Image quality assessment metrics by using directional projection," Chin. Opt. Lett. 6, 491 (2008)

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Songshan Xiao, Yongxing Wu, "Rotation-invariant texture analysis using Radon and Fourier transforms," Chin. Opt. Lett. 5, 513 (2007)

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Paper Information

Received: Dec. 11, 2006

Accepted: --

Published Online: Sep. 11, 2007

The Author Email: Songshan Xiao (moreblue@tju.edu.cn)

DOI:

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology