Target recognition of millimeter-wave security inspection images with small-sample long-tail distribution

ZHAO Wenlian; AN Jianfei; CHEN Ren’ai; CUI Zhenmao; DENG Peipei; WU Qiang; LIU Jie; CHENG Binbin; YU Yang

doi:10.11805/tkyda2023365

Journal of Terahertz Science and Electronic Information Technology , Volume. 23, Issue 5, 532(2025)

Target recognition of millimeter-wave security inspection images with small-sample long-tail distribution

ZHAO Wenlian^1,2,3, AN Jianfei^1,2, CHEN Ren’ai^1,2, CUI Zhenmao^1,2, DENG Peipei^1,2, WU Qiang^1,2, LIU Jie^1,2, CHENG Binbin^1,2, and YU Yang^1,2

Author Affiliations

¹Institute of Electronic Engineering, China Academy of Engineering Physics, Mianyang Sichuan 621999, China

²Microsystem and Terahertz Research Center, China Academy of Engineering Physics, Chengdu Sichuan 610200, China

³Graduate School of China Academy of Engineering Physics, Beijing 100088, China

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ZHAO Wenlian, AN Jianfei, CHEN Ren’ai, CUI Zhenmao, DENG Peipei, WU Qiang, LIU Jie, CHENG Binbin, YU Yang. Target recognition of millimeter-wave security inspection images with small-sample long-tail distribution[J]. Journal of Terahertz Science and Electronic Information Technology , 2025, 23(5): 532

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Paper Information

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Received: Nov. 14, 2023

Accepted: Jun. 5, 2025

Published Online: Jun. 5, 2025

The Author Email:

DOI:10.11805/tkyda2023365

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology