Chinese Journal of Lasers, Volume. 27, Issue 5, 411(2000)

Laser Ablation Mass Spectroscopy Analysis of Compound Semiconductor Materials

[in Chinese] and [in Chinese]
Author Affiliations
  • [in Chinese]
  • show less
    References(7)

    [1] [1] S. S. Alimpiev, M. E. Belov, S. M. Nikiforov. Laser ablation technique for trace element analysis. Anal. Chem., 1993, 65:3194~3198

    [2] [2] J. K. Gibson. Clusters directly formed from laser ablation of ytterbium oxide Yb3O+4 and Yb6O+8. J. Phys. Chem., 1994, 98(24):6063~6067

    [3] [3] Z. S. Li, S. Svanberg, E. Biemont et al.. Lifetime measurements in odd-parity Rydberg series of neutral lead by time-resolved laser spectroscopy. Phys. Rev. A, 1998, 57(5):3443~3449

    [4] [4] I. S. Borthwick, K. W. D. Ledingham, R. P. Singhal et al.. Diagnostic and analytical study of post ablation ionization of neutral atoms of major and minor constituents from a low alloy steel. Spectrochimia Acta Part B, 1996, 51:127~137

    [5] [5] A. Duckworth, R. S. Adrain, B. A. Tozer. Detection of laser-ablated caesium atoms with resonance ionization and time-of-flight mass spectrometry. J. Phys. D: Appl. Phys., 1991, 24(11):1925~1932

    [6] [6] A. Vertes, R. Gijbels, F. Adams. Laser Ionization Mass Analysis. New York: John Willy & Sons, Inc, 1993.

    [7] [7] K. Ichge, Y. Matsumoto, A. Namiki. Laser-induced desorption from compound semiconductors. Nucl. Instr. And Meth. B, 1988, 33:820~823

    Tools

    Get Citation

    Copy Citation Text

    [in Chinese], [in Chinese]. Laser Ablation Mass Spectroscopy Analysis of Compound Semiconductor Materials[J]. Chinese Journal of Lasers, 2000, 27(5): 411

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Save article for my favorites
    Paper Information

    Category: Laser physics

    Received: Dec. 21, 1998

    Accepted: --

    Published Online: Aug. 9, 2006

    The Author Email:

    DOI:

    Topics