Chinese Journal of Lasers, Volume. 28, Issue 12, 1079(2001)

Surface Plasma Wave Sub-nanometer Indicating System

[in Chinese]1, [in Chinese]1, and [in Chinese]2
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    References(4)

    [1] [1] Jiang Hong, Yu Xing-long. Liguid refractive index measurement using phase detection of surface plasma wave. Optical Technique, 2000, 26(1):41~45

    [2] [2] E. Kretschmann. The determination of the optical constants of metals by exciation of surface plasmons. Z. Physik, 1971, 241:313~324

    [3] [3] Zhu Zhaoming. Study on high-resolusion angle measurement using surface plasma resonance technique. Master Dissertation to Tsinghua University, 1998

    [4] [4] E. Helene, de Bruijn, S. F. Bert et al.. Determination of thickness and dielectirc constant of thin transparent dielectric layers using surface plasmon resonance. Opt. Comm., 1991, 82(5-6):425~432

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    [in Chinese], [in Chinese], [in Chinese]. Surface Plasma Wave Sub-nanometer Indicating System[J]. Chinese Journal of Lasers, 2001, 28(12): 1079

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    Paper Information

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    Received: Sep. 11, 2000

    Accepted: --

    Published Online: Aug. 10, 2006

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