Chinese Journal of Lasers, Volume. 49, Issue 6, 0603001(2022)

Regulation of Electric Field Intensity at Interface and Light Scattering Characteristics of Highly Reflective Multilayer Dielectric Films

Weirong Yang, Yongqiang Pan*, and Zhiqi Zheng
Author Affiliations
  • School of Optoelectronic Engineering, Xi’an Technological University, Xi’an, Shaanxi 710021, China
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    Figures & Tables(7)
    Schematic of space relationship of BRDF
    Surface reflectance of three film systems versus incident wavelength
    Square of normalized electric field intensity for three film systems. (a) G/(HL)8/A; (b) G/(HL)8H/A; (c) G/(HL)6H0.4L1.6H1.5L0.5H/A
    BR·cos θs versus scattering angle for three film systems
    Total scattering loss versus incident light wavelength for different film surfaces
    Measured BR·cos θs versus scattering angle for different film systems
    • Table 1. Square of normalized electric field intensity for different film system interfaces

      View table

      Table 1. Square of normalized electric field intensity for different film system interfaces

      InterfaceG /(HL)8/AG /(HL)8H/AG /(HL)6H0.4L1.6H1.5L0.5H/A
      Interface 13.988000.0044
      Interface 200.78970.4549
      Interface 31.679100.0244
      Interface 400.33250.2727
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    Weirong Yang, Yongqiang Pan, Zhiqi Zheng. Regulation of Electric Field Intensity at Interface and Light Scattering Characteristics of Highly Reflective Multilayer Dielectric Films[J]. Chinese Journal of Lasers, 2022, 49(6): 0603001

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    Paper Information

    Received: Jul. 6, 2021

    Accepted: Aug. 13, 2021

    Published Online: Mar. 2, 2022

    The Author Email: Yongqiang Pan (pyq_867@163.com)

    DOI:10.3788/CJL202249.0603001

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