Microelectronics, Volume. 51, Issue 1, 112(2021)
Study on Differential Negative Resistance of Submicron ESD-Implanted NMOS IDT-VGS Under High Electric Field
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LIU Yukui, YIN Wanjun, TAN Kaizhou, CUI Wei. Study on Differential Negative Resistance of Submicron ESD-Implanted NMOS IDT-VGS Under High Electric Field[J]. Microelectronics, 2021, 51(1): 112
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Received: Jul. 14, 2020
Accepted: --
Published Online: Mar. 11, 2022
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