Acta Optica Sinica, Volume. 40, Issue 15, 1512002(2020)

Periodic Light Disturbance in Fringe Projection Profilometry

Yipeng Xiao1, Chaoxia Shi1、*, and Feipeng Da2,3、**
Author Affiliations
  • 1School of Computer Science and Engineering, Nanjing University of Technology, Nanjing, Jiangsu 210094, China
  • 2School of Automation, Southeast University, Nanjing, Jiangsu 210096, China
  • 3Key Laboratory of Measurement and Control of Complex Systems of Engineering, Ministry of Education, Nanjing, Jiangsu 211096, China
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    References(14)

    [3] Chen C, Yu J, Gao N et al. High accuracy 3D calibration method of phase calculation-based fringe projection system by using LCD screen considering refraction error[J]. Optics and Lasers in Engineering, 126, 105870(2020).

    [5] Yin W, Cheng X S, Xie J R et al. High-speed 3D profilometry employing HSI color model for color surface with discontinuities[J]. Optics & Laser Technology, 96, 81-87(2017).

    [6] Li H R, Feng G Y, Yang P et al. Online fringe projection profilometry based on scale-invariant feature transform[J]. Optical Engineering, 55, 084101(2016).

    [7] Bing P, Qian K M, Lei H et al. Phase error analysis and compensation for nonsinusoidal waveforms in phase-shifting digital fringe projection profilometry[J]. Optics Letters, 34, 416-418(2009).

    [9] Zhong M, Chen F, Xiao C et al. Noise reduction in modulation measurement profilometry based on the wavelet transform method[J]. Optical Engineering, 57, 054102(2018).

    [11] Rao L, Da F P. Phase error correction method for fringe projection profilometry systems while considering random noises and objects' reflectivity[J]. Proceedings of SPIE, 1082, 1082702(2018).

    [12] Marc F, Marcus P, Rainer T. Model-based noise prediction for fringe projection systems-a tool for the statistical analysis of evaluation algorithms[J]. Technical Measurement, 84, 111-122(2017).

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    Yipeng Xiao, Chaoxia Shi, Feipeng Da. Periodic Light Disturbance in Fringe Projection Profilometry[J]. Acta Optica Sinica, 2020, 40(15): 1512002

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Feb. 25, 2020

    Accepted: Apr. 30, 2020

    Published Online: Aug. 14, 2020

    The Author Email: Shi Chaoxia (scx@njust.edu.cn), Da Feipeng (dafp@seu.edu.cn)

    DOI:10.3788/AOS202040.1512002

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