Researching | Fast Face Image Retrieval Based on Depth Feature

Acta Optica Sinica, Volume. 38, Issue 10, 1010004(2018)

Fast Face Image Retrieval Based on Depth Feature

Zhendong Li^1,2、*, Yong Zhong^1,2, Man Chen^1,2, and Dongping Cao^1,2

Author Affiliations

¹ Chengdu Institute of Computer Application, Chinese Academy of Sciences, Chengdu, Sichuan 610041, China

² University of Chinese Academy of Sciences, Beijing 100049, China

show less

Abstract Get PDF(in Chinese)

Figures&Tables (5)

Paper Information

Figures & Tables(5)

Fig. 1. Face image feature extraction

Download full size

Fig. 2. Examples of face images

Download full size

Fig. 3. Part of the face retrieval results. (a) Face image to be retrieved (blue box); (b) correctly retrieved results (green box); (c) error retrieved results (red box)

Download full size

Table 1. Face retrieval results
View table
Table 1. Face retrieval results
ImageSet QE Speed /s^-1 Top20-AP mAP
CASIA-3D FaceV1 No 0.081 98.19 95.44
m=5 0.085 99.3 98.1
m=10 0.089 99.52 98.86
CASIA-3D FaceV1+LFW No 0.1 98.19 95.44
m=5 0.105 99.29 98.06
m=10 0.118 99.52 98.84

Table 2. Results and timeliness comparison

Table 2. Results and timeliness comparison

Method	mAP	Speed /s^-1
L-K one node^[1]	77.5	0.33
L-K two node^[1]	86.0	0.67
L-K three node^[1]	91.0	1.05
L-K four node^[1]	93.5	1.32
L-K five node^[1]	95.1	1.65
Ref. [13] method	92.11	0.331
Ref. [13] method+QE	95.7	0.338
DCNNFR	95.44	0.1
DCNNFR+QE	98.84	0.118

Tools

Get Citation

Copy Citation Text

Zhendong Li, Yong Zhong, Man Chen, Dongping Cao. Fast Face Image Retrieval Based on Depth Feature[J]. Acta Optica Sinica, 2018, 38(10): 1010004

Download Citation

EndNote(RIS)BibTex Plain Text

Set citation alerts for article

Save article for my favorites

Paper Information

Category: Image Processing

Received: Jan. 22, 2018

Accepted: May. 25, 2018

Published Online: May. 9, 2019

The Author Email:

DOI:10.3788/AOS201838.1010004

Topics

laser devices and laser physics

Lasers and Laser Optics

laser manufacturing

Instrumentation, Measurement and Metrology