Acta Optica Sinica, Volume. 19, Issue 12, 1649(1999)

Quantitative Analysis of Aliasing Effects in Opto-Electric Imaging Systems

[in Chinese] and [in Chinese]
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    References(4)

    [2] [2] Bell B W, Koliopoulos C L. Moire topography, sampling theory, and charged-coupled devices. Opt. Lett., 1984, 9(5):171~173

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    CLP Journals

    [1] Zheng Bo, Wang Jian, Xu Wenbin, Wang Xiaodong, Sun Qiang. Aliasing effect of the IR focal plane arrays based on angular-dependence model[J]. Infrared and Laser Engineering, 2016, 45(11): 1104001

    [2] Shi Haoran, Li Zhaolong, Shen Tongsheng, Lou Shuli. Aliasing effect of sampled infrared imaging system[J]. Infrared and Laser Engineering, 2016, 45(4): 404003

    [3] Gao Meijing, Gu Haihua, Guan Congrong, Wu Weilong. Adaptive Position Calibration for Thermal Microscopic Imaging System[J]. Acta Optica Sinica, 2013, 33(1): 111002

    [4] Gao Meijing, Jin Weiqi, Wang Xia, Yu Jie. Zero Calibration for the Designed Microscanning Thermal Microscopic Imaging System[J]. Acta Optica Sinica, 2009, 29(8): 2175

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    [in Chinese], [in Chinese]. Quantitative Analysis of Aliasing Effects in Opto-Electric Imaging Systems[J]. Acta Optica Sinica, 1999, 19(12): 1649

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    Paper Information

    Category: Fourier optics and signal processing

    Received: Jul. 21, 1998

    Accepted: --

    Published Online: Aug. 9, 2006

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