Journal of Synthetic Crystals, Volume. 53, Issue 10, 1745(2024)

Characterization of Micro-Scratches on 4H-SiC Substrates by KCl Solution Crystallization-Assisted Method

ZHANG Chitengfei1, ZHANG Song2, GONG Ruocheng3, YANG Junwei3,4, and SONG Huaping3,4、*
Author Affiliations
  • 1Hubei Longzhong Laboratory, Xiangyang 441000, China
  • 2State Key Laboratory of Advanced Technology for Materials Synthesis and Processing, Wuhan University of Technology, Wuhan 430070, China
  • 3Songshan Lake Materials Laboratory, Dongguan 523808, China
  • 4PowerEpi Semiconductor Co., Ltd., Dongguan 523786, China
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    ZHANG Chitengfei, ZHANG Song, GONG Ruocheng, YANG Junwei, SONG Huaping. Characterization of Micro-Scratches on 4H-SiC Substrates by KCl Solution Crystallization-Assisted Method[J]. Journal of Synthetic Crystals, 2024, 53(10): 1745

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    Paper Information

    Category:

    Received: May. 28, 2024

    Accepted: Jan. 17, 2025

    Published Online: Jan. 17, 2025

    The Author Email: SONG Huaping (songhp211@163.com)

    DOI:

    CSTR:32186.14.

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