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Optoelectronics Letters, Volume. 20, Issue 1, 12(2024)

Fabrication and characterization of high-damage resis-tance Zn-diffused MgO: PPLN ridge waveguides

Xing CHENG1...2,3, Xinkai FENG2,3, Lei MA2,3, Jiaying CHEN2,3, Huaixi CHEN2,3,*, and Wanguo and LIANG23 |Show fewer author(s)
Author Affiliations
  • 1College of Chemistry, Fuzhou University, Fuzhou 350108, China
  • 2Fujian Institute of Research on the Structure of Matter, Chinese Academy of Sciences, Fuzhou 350108, China
  • 3Fujian Science & Technology Innovation Laboratory for Optoelectronic Information of China, Fuzhou 350108, China
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    CHENG Xing, FENG Xinkai, MA Lei, CHEN Jiaying, CHEN Huaixi, and LIANG Wanguo. Fabrication and characterization of high-damage resis-tance Zn-diffused MgO: PPLN ridge waveguides[J]. Optoelectronics Letters, 2024, 20(1): 12

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    Paper Information

    Received: Mar. 23, 2023

    Accepted: Jul. 26, 2023

    Published Online: May. 15, 2024

    The Author Email: CHEN Huaixi (hxchen@fjirsm.ac.cn)

    DOI:10.1007/s11801-024-3051-3

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology