[1] [1] Jonas Sandsten, Hans Edner, Sune Svanberg. Gas imaging by infrared gas-correlation spectrometry [J]. Opt. Lett., 1996, 21(23):1945～1947

[2] [2] Michiaki Endo, Haruo Yashida, Yasuhiro Maeda. Infrared monitoring system for the detection of organic contamination on a 300 mm Si wafer [J]. Appl. Phys. Lett., 1999, 75(4):519～521

[3] [3] Y. Nagasawa, A. Ishitani. Application of Fourier transform infrared emission spectrometry to surface analysis [J]. Appl. Spectroscopy, 1984, 38(2):166～173

[4] [4] Lawrence Mertz. Fourier Transfrom Spectrometry [M]. John Wiley & Sons Inc., 1965. 1～14

[5] [5] J. Courtial, B. A. Petterson, W. Hirst et al.. Static Fourier-transform ultroviolet spectrometer for gas detection [J]. Appl. Opt., 1997, 36(13):2813～2817

[6] [6] Fujin Long, Teresa B. Fraeedman, Thomas J. Tague et al.. Step-sacn Fourier transform vibrational circular dichroism measurements in the vibrational region above 2000 cm-1 [J]. Appl. Spectroscopy, 1997, 54(4):508～511

[7] [7] Brian R. Stallard, Robert K. Rowe, Arnold J. Howard et al.. Near in-frared spectroscopy with a dispersive waveguide [J]. Appl. Spectroscopy, 1997, 51(6):880～882

[8] [8] Hirokazu Matsumoto, Akiko Hirai. A white-light interferometer using a lamp source and heterodyne detection with acousto-optic modulators [J]. Opt. Comm., 1999, 170:217～220

[9] [9] Akiko Hirai, Lijiang Zeng, Hirokazu Matsumoto. Heterodyne Fourier transform spectroscopy using moving diffration grating [J]. Jap. J. Appl. Phys., 2001, 40(10):6138～6142

[10] [10] W. H. Stevenson. Optical frequency shifting by means of a rotating diffraction grating [J]. Appl. Opt., 1970, 9(3):649～652