Chinese Journal of Lasers, Volume. 35, Issue 6, 916(2008)
Optical Thin Films Interfaces Roughness Cross-Correlated Properties and Light Scattering
[1] [1] R. Haelbich, A. Segmiiller. Smooth multilayer films suitable for X-ray mirrors[J]. Appl. Phys. Lett., 1979, 34(3):184~186
[4] [4] Claude Amra, C. Grèzes-Besset, L. Bruel. Comparison of surface and bulk scattering in optical multilayers[J]. Appl. Opt., 1993, 32(28):5492~5503
[8] [8] C. Amra, G. Albrand, P. Roche. Theory and application of antiscattering single layers:antiscattering antireflection coatings[J]. Appl. Opt., 1986, 25(16):2695~2702
[9] [9] P. Roche, P. Bousquet, F. Flory et al.. Determination of interface roughness cross-correlated properties of an optical coating from measurements of the angular scattering[J]. J. Opt. Soc. Am. A, 1984, 1(10):1208~1230
[11] [11] J. M. Elson. Theory of light scattering from a rough surfaces with an inhomogeneous dielectric permittivity[J]. Phys. Rev. B, 1984, 30(10):5460~5480
[12] [12] P. Bousquet, F. Flory, P. Roche. Scattering from multilayer thin films: theory and experiment[J]. J. Opt. Soc. Am., 1981, 71(9):1115~1123
[13] [13] C. Amra. Light scattering from multilayer optics. Ⅰ. Tools of investigation[J]. J. Opt. Soc. Am. A, 1994, 11(1):197~210
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Pan Yongqiang, Wu Zhensen, Hang Lingxia. Optical Thin Films Interfaces Roughness Cross-Correlated Properties and Light Scattering[J]. Chinese Journal of Lasers, 2008, 35(6): 916