Acta Physica Sinica, Volume. 68, Issue 21, 216101-1(2019)
Fig. 1. Irradiation damage (dpa) in V-4Cr-4Ti/Ti samples calculated by SRIM2008 software.由SRIM软件计算得到的V-4Cr-4Ti和Ti的辐照损伤随样品深度的变化
Fig. 2. The SEM morphology and EDS line analysis of V-4Cr-4Ti/Ti samples: (a) Before and (b) after irradiation; the positions of FIB samples are marked with white rectangles.V-4Cr-4Ti/Ti界面区域及两侧基体在(a) 辐照前和 (b) 辐照后的SEM形貌图及对应的EDS元素线扫描分析结果; 图中的白色长方形区域为FIB的取样位置
Fig. 3. Vickers hardness distribution across the interface of the V-4Cr-4Ti/Ti.V-4Cr-4Ti/Ti界面及两侧基体区域的硬度分布
Fig. 4. The TEM images of V-4Cr-4Ti/Ti after irradiation: (a) V-4Cr-4Ti; (b) interface I; (c) interface II; (d) Ti.V-4Cr-4Ti/Ti界面区域及两侧基体辐照后的TEM形貌图 (a) 钒基体; (b) 界面I; (c) 界面II; (d) 钛基体
Fig. 5. Dislocation density (a) and diameter (b) distribution across the interface.辐照后V-4Cr-4Ti/Ti界面及两侧基体的位错密度(a) 和尺寸 (b)
Fig. 6. STEM images of V-4Cr-4Ti/Ti interface after irradiation: (a) V-4Cr-4Ti; (b) interface I; (c) interface II.辐照后界面处的STEM形貌图 (a) 钒基体; (b) 界面I; (c) 界面II
Fig. 7. EDS analysis of the V-4Cr-4Ti/Ti: (a) Interface before irradiation; (b) V-4Cr-4Ti after irradiation; (c) interface I after irradiation; (d) interface II after irradiation.辐照前后析出物EDS分析结果 (a) 辐照前界面; (b) 辐照后钒基体; (c) 辐照后界面I; (d) 辐照后界面II
Fig. 8. EDS-mapping analysis of the V-4Cr-4Ti and interface I after irradiation: (a)−(d) V-4Cr-4Ti; (e)−(h) interface I.辐照后钒基体和界面I处析出物EDS面扫描分析结果 (a)—(d) 钒基体; (e)—(h) 界面I
Fig. 9. Diffraction analysis of irradiated samples: (a) V-4Cr-4Ti; (b) Ti; (c), (d) interface I; (e) (f) interface II.辐照后样品不同区域的选区电子衍射分析结果 (a) 钒基体; (b) 钛基体; (c), (d) 界面I; (e), (f) 界面II
Experimental hardness values by nanoindentation and the estimated hardness values calculated by the DBH model
通过纳米压痕所得硬化实验值与采用DBH模型对辐照硬化进行的估算值
Experimental hardness values by nanoindentation and the estimated hardness values calculated by the DBH model
通过纳米压痕所得硬化实验值与采用DBH模型对辐照硬化进行的估算值
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Ran-Ran Li, Yi-Fan Zhang, Dian-Cheng Geng, Gao-Wei Zhang, Hideo Watanabe, Wen-Tuo Han, Fa-Rong Wan.
Received: Aug. 6, 2019
Accepted: --
Published Online: Sep. 17, 2020
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