[1] [1] D. Ristau, H. Ehlers, S. Schlichting, and M. Lappschies, Proc. SPIE 7101, 71010C (2008).

[2] [2] B. Vidal, A. Fornier, and E. Pelletier, Appl. Opt. 18, 3851 (1979).

[3] [3] M. Lappschies, T. Gross, H. Ehlers, and D. Ristau, Proc. SPIE 5250, 637 (2004).

[4] [4] C. Holm, Appl. Opt. 8, 1978 (1979).

[5] [5] S. Schlichting, K. Heinrich, H. Ehlers and D. Ristau, Proc. SPIE 8168, 81681E (2011).

[6] [6] D. Ristau, D. T. Gross, M. Lappschies, and H. Ehlers, Appl. Opt. 45, 1495 (2006).

[7] [7] M. Scherer, U. Schallenberg, H. Hagedorn, W. Lehnert, B. Romanov, and A. Zoeller, Proc. SPIE 7101, 71010I (2008).

[8] [8] B. T. Sullivan and G. Carlow, in Proceedings of Optical Interference Coatings (OIC) TuC1 (2010).

[9] [9] K. D. Hendrix, C. A. Hulse, G. J. Ockenfuss, and R. B. Sargent, Proc. SPIE 7067, 706702 (2008).

[10] [10] M. Lappschies, U. Schallenberg, and S. Jakobs, Proc. SPIE 8168, 81680Y (2011).

[11] [11] V. Pervak, Appl. Opt. 50, C55 (2010).

[12] [12] D. Ristau and T. Gross, Proc. SPIE 5963, 596313 (2005).

[13] [13] D. Ristau, in Proceedings of the 8th International Conference on Coatings on Glass and Plastics 203 (2010).

[14] [14] K. Starke and D. Ristau, in Proceedings of the 54th Annual Technical Conference, Proceedings of the Society of Vacuum Coaters 463 (2011).

[15] [15] M. Lappschies, B. Gortz, and D. Ristau, Proc. SPIE 5963, 59631Z (2005).

[16] [16] A. Zoeller, M. Boos, H. Hagedorn, A. Kobiak, H. Reus, and B. Romanov, in Proceedings of Optical Interference Coatings (OIC) WC3 (2007).

[17] [17] H. Ehlers, S. Schlichting, C. Schmitz, and D. Ristau, Proc. SPIE 8168, 81681F (2011).

[18] [18] S. Wilbrandt, N. Kaiser, and O. Stenzel, "Method for measuring optical characteristics of movable probe in coating installation, involves measuring intensity of transmitted beam by probe at transmission detector" (in German) German Patent DE102009012756A1 (2010).

[19] [19] H. Schwiecker, K. H. Hammann, and U. Schneider, Proc. SPIE 1012, 16 (1989).

[20] [20] E. Masetti, M. Montecchi, R. Larciprete, and S. Cozzi, Appl. Opt. 35, 5626 (1996).

[21] [21] D. Rademacher, M. Vergohl, and U. Richter, Appl. Opt. 50, C222 (2011).

[22] [22] H. Ehlers, S. Schlichting, C. Schmitz, and D. Ristau, Chin. Opt. Lett. 8, 62 (2010).

[23] [23] A. V. Tikhonravov and M. K. Trubetskov, Appl. Opt. 44, 6877 (2005).

[24] [24] A. Zoller, M. Boos, H. Hagedorn, and B. Romanov, Proc. SPIE 7101, 71010G (2008).

[25] [25] T. V. Amotchkina, M. K. Trubetskov, V. Pervak, S. Schlichting, H. Ehlers, D. Ristau, and A. V. Tikhonravov, Appl. Opt. 50, 3389 (2011).

[26] [26] N. Baguer, V. Georgieva, L. Calderin, I. T. Todorov, S. Van Gils, and A. Bogaerts, J. Cryst. Growth 311, 4034 (2009).

[27] [27] V. Georgieva, I. Todorov, and A. Bogaerts, Chem. Phys. Lett. 485, 315 (2010).

[28] [28] J. Habasaki and I. Okada, Mol. Simulat. 9, 319 (1992).

[29] [29] A. Carree, J. Horbach, S. Ispas, and W. Kob, Europhys. Lett. 82, 17001 (2008).

[30] [30] V. Van Hoang, Phys. Status Solidi B 244, 1280 (2007).

[31] [31] M. Matsui and M. Akaogi, Mol. Simulat. 6, 239 (1991).

[32] [32] O. Stenzel, S. Wilbrandt, N. Kaiser, C. Schmitz, M. Turowski, D. Ristau, P. Awakowicz, R. P. Brinkmann, T. Musch, I. Rolfes, H. Steffen, R. Foest, A. Ohl, T. Kohler, G. Dolgonos, and T. Frauenheim, Proc. SPIE 8168, 81680L (2011).

[33] [33] G. Gutierrez, E. Menendez-Proupin, C. Loyola, J. Peralta, and S. Davis, J. Mater. Sci. 45, 5124 (2010).