Fig. 1. Schematic of OVNA measurement system based on optical single sideband modulation

Fig. 2. Schematic of tunable silicon nitride micro-ring

Fig. 3. Variation between measured delay and average delay of OVNA system

Fig. 4. Test of resonance peak deviation. (a) Micro-ring delay spectra of multiple measurements; (b) resonance frequency fluctuation of 20 measurements

Fig. 5. Comparison between delay spectrum of single measurement and average delay spectrum of 20 measurements

Fig. 6. Comparison of delay spectra after frequency-domain alignment. (a) Delay spectra of multiple measurements; (b) delay spectrum of single measurement, average delay spectrum of 20 measurements, and average delay spectrum of 20 measurements after frequency-domain alignment

Fig. 7. Measurement and fitting for micro-ring amplitude spectra. (a) Micro-ring amplitude spectra measured by LMS and OVNA; (b) fitting of micro-ring transmission spectrum

Fig. 8. Comparison of delay spectra obtained by OVNA measurement and theoretical fitting

Fig. 9. Transmission and delay spectra of micro-ring under different driving voltages. (a) Micro-ring transmission spectra measured by LMS; (b) theoretical fitting delay spectra corresponding to transmission spectra

Fig. 10. Extinction ratio and delay measurement under different driving voltages. (a) Extinction ratio measured by LMS and OVNA; (b) delay obtained by theoretical fitting and OVNA measurement