Journal of Semiconductors, Volume. 41, Issue 1, 012101(2020)
Surface traps-related nonvolatile resistive switching memory effect in a single SnO2:Sm nanowire
Fig. 1. (Color online) Structure and morphology characterization of as-synthesized product. (a) XRD pattern. (b) FESEM image.
Fig. 2.
Fig. 3. For the step (1) and (2) curve in
Fig. 4. (Color online) Under only unidirectional voltage sweeping at a forward-biased bias from 0 to +10 V,
Fig. 5.
Fig. 6. (Color online) Memory properties of a single nanowire-based device. (a) 7 consecutive writing-reading-erasing-reading cycles, where +6.5, +10, and –10 V are selected as reading, writing and erasing voltage, respectively. (b) An enlargement of a dotted frame in (a).
Fig. 7. (Color online) Memory properties of a single nanowire-based device. (a) 7 consecutive writing-reading-erasing-reading cycles, where +7, +10, and –10 V are selected as reading, writing and erasing voltage, respectively. (b) An enlargement of a dotted frame in (a).
Fig. 8. (Color online) Under different pulse voltages, the response curves of the device current. (a) Consecutive pulse between +7 and +10 V. (b) Consecutive pulse between +7 and –10 V.
Fig. 9. (Color online) Stability of device current in LRS and HRS at a reading voltage of 6.5 V.
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Huiying Zhou, Haiping Shi, Baochang Cheng. Surface traps-related nonvolatile resistive switching memory effect in a single SnO2:Sm nanowire[J]. Journal of Semiconductors, 2020, 41(1): 012101
Category: Articles
Received: Oct. 8, 2019
Accepted: --
Published Online: Sep. 10, 2021
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