Laser Technology, Volume. 46, Issue 2, 288(2022)
Analysis of optical constants of TiO2 thin film based on in-situ common angle ellipsometry and reflection
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SUN Xiaojuan, HAN Peigao, JUAN Fangying, HAO Dianzhong. Analysis of optical constants of TiO2 thin film based on in-situ common angle ellipsometry and reflection[J]. Laser Technology, 2022, 46(2): 288
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Received: Jan. 18, 2021
Accepted: --
Published Online: Mar. 8, 2022
The Author Email: HAN Peigao (pghan@foxmail.com)
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