Researching | Displacement damage effects in MoS2-based electronics

Journal of Semiconductors, Volume. 45, Issue 12, 122701(2024)

Displacement damage effects in MoS₂-based electronics

Kaiyue He^1、†, Zhanqi Li^1、†, Taotao Li, Yifu Sun, Shitong Zhu, Chao Wu, Huiping Zhu, Peng Lu, Xinran Wang, and Maguang Zhu^*

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School of Integrated Circuits, Nanjing University, Suzhou 215000, China

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Kaiyue He, Zhanqi Li, Taotao Li, Yifu Sun, Shitong Zhu, Chao Wu, Huiping Zhu, Peng Lu, Xinran Wang, Maguang Zhu. Displacement damage effects in MoS₂-based electronics[J]. Journal of Semiconductors, 2024, 45(12): 122701

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Paper Information

Category: Research Articles

Received: Sep. 15, 2024

Accepted: --

Published Online: Jan. 15, 2025

The Author Email: Maguang Zhu (MGZhu)

DOI:10.1088/1674-4926/24090027

Topics

laser devices and laser physics

Lasers and Laser Optics

laser manufacturing

Instrumentation, Measurement and Metrology