Microelectronics, Volume. 51, Issue 3, 374(2021)
Review of Error Mitigation Techniques in NAND Flash Memorys
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CAO Fuyuan, LIU Yang, HUO Zongliang. Review of Error Mitigation Techniques in NAND Flash Memorys[J]. Microelectronics, 2021, 51(3): 374
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Received: Jan. 6, 2021
Accepted: --
Published Online: Mar. 11, 2022
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