Technical Characteristics and Error Analysis of Starlight Measurement Based on Moiré Fringes

Fang GUO; Weifeng DU; Xunjiang ZHENG; Zhilong YE; Xuwei ZHANG

doi:10.19328/j.cnki.2096-8655.2025.03.012

AEROSPACE SHANGHAI, Volume. 42, Issue 3, 95(2025)

Technical Characteristics and Error Analysis of Starlight Measurement Based on Moiré Fringes

Fang GUO^1,2,3, Weifeng DU^1,2,3、*, Xunjiang ZHENG^1,2,3, Zhilong YE^1,2,3, and Xuwei ZHANG^1,2,3

Author Affiliations

¹Shanghai Aerospace Control Technology Institute，Shanghai201109，China

²Shanghai Key Laboratory of Aerospace Intelligent Control Technology，Shanghai201109，China

³National Key Laboratory of Space Target Awareness，Shanghai201109，China

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References(2)

[7] R A HUTCHIN. Interferometric tracking device. US.

[19] J DU, J BAI, L WANG et al. Optical design and accuracy analysis of interferometric star tracker. Proceedings of SPIE, 10815(2018).

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Fang GUO, Weifeng DU, Xunjiang ZHENG, Zhilong YE, Xuwei ZHANG. Technical Characteristics and Error Analysis of Starlight Measurement Based on Moiré Fringes[J]. AEROSPACE SHANGHAI, 2025, 42(3): 95

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Paper Information

Category: Guidance, Navigation, Control and Electronics

Received: Aug. 22, 2024

Accepted: --

Published Online: Sep. 29, 2025

The Author Email:

DOI:10.19328/j.cnki.2096-8655.2025.03.012

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology