Accuracy Improvement of Temperature Calculation of the Laser-Induced Plasma Using Wavelet Transform Baseline Subtraction

LIU Li; XIAO Ping-ping

doi:10.3964/j.issn.1000-0593(2016)02-0545-05

Spectroscopy and Spectral Analysis, Volume. 36, Issue 2, 545(2016)

Accuracy Improvement of Temperature Calculation of the Laser-Induced Plasma Using Wavelet Transform Baseline Subtraction

LIU Li and XIAO Ping-ping

Author Affiliations

[in Chinese]

show less

Abstract Get PDF(in Chinese)

References(11)

[1] [1] Singh J P, Thakur S N. Laser-induced Breakdown Spectroscopy. 1st ed. Amsterdam: Elsevier, 2007. 197.

[2] [2] Hahn D W, Omenetto N. Applied Spectroscopy, 2010, 64: 335A.

[3] [3] Wang Z, Yuan T B, Hou Z Y, et al. Frontiers of Physics, 2014, 9: 419.

[4] [4] Hahn D W, Omenetto N. Applied Spectroscopy, 2012, 66: 347.

[5] [5] Cristoforetti G, Tognoni E, Gizzi L A. Spectrochimica Acta Part B: Atomic Spectroscopy, 2013, 90: 1.

[6] [6] Aguilera J A, Aragon C. Applied Surface Science, 2002, 197: 273.

[7] [7] Yaroshchyk P, Eberhardt J E. Spectrochimica Acta Part B: Atomic Spectoscopy, 2014, 99: 138.

[8] [8] Sun L, Yu H. Spectrochimica Acta Part B: Atomic Spectoscopy, 2009, 64: 278.

[9] [9] Yuan T B, Wang Z, Li Z, et al. Analytica Chimica Acta, 2013, 807: 29.

[10] [10] Zou X H, Guo L B, Shen M, et al. Optics Express, 2014, 22: 10233.

[12] [12] Bker D, Brüggemann D. Spectrochimica Acta Part B: Atomic Spectoscopy, 2011, 66: 28.

Tools

Get Citation

Copy Citation Text

LIU Li, XIAO Ping-ping. Accuracy Improvement of Temperature Calculation of the Laser-Induced Plasma Using Wavelet Transform Baseline Subtraction[J]. Spectroscopy and Spectral Analysis, 2016, 36(2): 545

Download Citation

EndNote(RIS)BibTex Plain Text

Set citation alerts for article

Save article for my favorites

Paper Information

Received: Nov. 16, 2014

Accepted: --

Published Online: Dec. 9, 2016

The Author Email:

DOI:10.3964/j.issn.1000-0593(2016)02-0545-05

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology