[1] [1] J. Ruckman, E. M. Fess, and D. V. Gee, Proc. SPIE. 3782, 2 (1992).

[2] [2] B. Du, L. Li, and Y. Huang, Chin. Opt. Lett. 8, 569 (2010).

[3] [3] F. Yan, D. Fan, B. Zhang, L. Yin, R. Li, and X. Zhang, Chin. Opt. Lett. 7, 534 (2009).

[4] [4] X. Wang, L. Wang, L. Yin, B. Zhang, D. Fan, and X. Zhang, Chin. Opt. Lett. 5, 645 (2007).

[5] [5] L. A. Selberg, Opt. Eng. 31, 1961 (1992).

[6] [6] C. Zhao, R. Zehnder, and J. H. Burge, Opt. Eng. 44, 090506 (2005).

[7] [7] H. Wang, Y. Li, L. Zeng, C. Yin, and Z. Feng, Opt. Commun. 232, 61 (2004).

[8] [8] R. Diaz-Uribe and A. Cornejo-Rodriguez, Appl. Opt. 25, 3731 (1986).

[9] [9] D. Baiocchi and J. H. Burge, Proc. SPIE 4093, 58 (2000).

[10] [10] D. Malacara, Optical Shop Testing (Wiley, 1992).

[11] [11] J. A. Connelly, B. J. Bos, and P. S. Davila, Proc. SPIE. 7068, 70680F (2008).

[12] [12] S. Aguado, D. Samper, J. Santolaria, and J. J. Aguilar, Proc. Eng. 63, 582 (2013).

[13] [13] A. Nubiola and I. A. Bonev, Robot. Comput.-Integr. Manuf. 29, 236 (2013).