Identification Method of Refurbished Electronic Components Based on Optical Interferometry

[5] [5] Stradley J, Karraker D. The electronic part supply chain and risks of counterfeit parts in defense applications[J]. IEEE Trans. on Components and Packaging Technologies, 2006, 29(3): 703705.

CLP Journals

[1] MAO Lulu, LIANG Lili, LIANG Jiyun. Phase Solution of Extremum Feature of Grating Projection Interferogram with Random Step Size[J]. Semiconductor Optoelectronics, 2022, 43(5): 942

Tools

Get Citation

Copy Citation Text

WEN Jingchao, WU Liqiang, ZHAO Yanfei, YU Wang. Identification Method of Refurbished Electronic Components Based on Optical Interferometry[J]. Semiconductor Optoelectronics, 2020, 41(6): 822

Download Citation

EndNote(RIS)BibTex Plain Text

Set citation alerts for article

Save article for my favorites