Semiconductor Optoelectronics, Volume. 41, Issue 6, 822(2020)

Identification Method of Refurbished Electronic Components Based on Optical Interferometry

WEN Jingchao*... WU Liqiang, ZHAO Yanfei and YU Wang |Show fewer author(s)
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    Refurbished electronic components present serious potential quality problems, which will pose serious threats to the quality and safety of space equipments. In order to ensure the quality and reliability of installed electronic components, a nondestructive measurement method is proposed for identifying refurbished components based on their characteristics. Firstly, the measurement methods and principles are described: the roughness of both the top and the bottom surfaces of the device is measured quantitatively by optical interferometry, and then the difference between the two roughness values will be used to judge whether the surface of the device was refurbished or not. Lastly, the surface roughness of the normal and refurbished components is compared and analyzed, and the uncertainty evaluation is carried out. It is shown that this method can be used to identify refurbished components efficiently and accurately. It provides a new measurement method for improving the quality of aerospace electronic components.

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    WEN Jingchao, WU Liqiang, ZHAO Yanfei, YU Wang. Identification Method of Refurbished Electronic Components Based on Optical Interferometry[J]. Semiconductor Optoelectronics, 2020, 41(6): 822

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    Paper Information

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    Received: Aug. 3, 2020

    Accepted: --

    Published Online: Jan. 22, 2021

    The Author Email: Jingchao WEN (wenjingchao521@163.com)

    DOI:10.16818/j.issn1001-5868.2020.06.012

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