High Power Laser Science and Engineering, Volume. 8, Issue 4, 04000e44(2020)
Strong-field effects induced in the extreme ultraviolet domain
Fig. 1. PES of the two-photon He ionization by a pulse train of an envelope fs, pulse duration
as, synthesized by the 11th–15th harmonics with relative intensities 0.19:0.4:0.41, respectively, for different total XUV intensities ranging from
W/cm
to
W/cm
(top plot); PES peak shifts as a function of the total XUV intensity in the interval ranging from 0 to
W/cm
(bottom plot).
Fig. 2. XUV EIT schemes in He through coupling of a bound with (a) an AIS or (b) two AISs.
Fig. 4. Photoelectron peak shifts observed with ionizing XUV intensity in single-photon ionization of Ar. Xe gas was utilized as the generating medium and a Sn filter was used for spectral selection. The spectra are obtained at two different XUV energies, measured by a calibrated XUV photodiode: 1.8 μJ/pulse (upper black line, shifted in
Fig. 5. Harmonic spectra recorded by a flat-field XUV spectrometer (FFS) varying the peak gas density of Xe at the harmonic generation region: cm
(upper black line, shifted in
cm
(lower red line). The observed blueshift is of the order of
eV.
Fig. 6. Ionization of lithium with a radiation field around 73.1 eV (H47) couples two AIS states. The lower state decays to Li
whereas the higher state decays to Li
.
Fig. 7. Ionization of lithium with a radiation field around 73.1 eV (H47) coupling two AIS states. We plot the population ratios of Li
/Li
for various coupling strengths of
and for peak intensity
W/cm
. The multiplication factor for the
coupling is shown in the inset. Values for
and
can be found in Ref. [48].
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I. Makos, I. Orfanos, E. Skantzakis, I. Liontos, P. Tzallas, A. Forembski, L. A. A. Nikolopoulos, D. Charalambidis. Strong-field effects induced in the extreme ultraviolet domain[J]. High Power Laser Science and Engineering, 2020, 8(4): 04000e44
Category: Research Articles
Received: Sep. 30, 2020
Accepted: Oct. 26, 2020
Posted: Oct. 27, 2020
Published Online: Jan. 5, 2021
The Author Email: D. Charalambidis (chara@iesl.forth.gr)