Spectroscopy and Spectral Analysis, Volume. 41, Issue 11, 3456(2021)

Deep-Surface Analysis of Multi-Layered Turbid Samples Using Inverse Spatially Offset Raman Spectroscopy

Fan YU1、1;, He-ping LI1、1;, Tian-yu ZHAO1、1;, Zhuo-wen LIANG2、2;, Hang ZHAO1、1;, and Shuang WANG1、1; *;
Author Affiliations
  • 11. Institute of Photonics and Photon-Technology, Northwest University, Xi’an 710069, China
  • 22. Department of Orthopaedics, Xijing Hospital, Air Force Military Medical University, Xi’an 710032, China
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    Fan YU, He-ping LI, Tian-yu ZHAO, Zhuo-wen LIANG, Hang ZHAO, Shuang WANG. Deep-Surface Analysis of Multi-Layered Turbid Samples Using Inverse Spatially Offset Raman Spectroscopy[J]. Spectroscopy and Spectral Analysis, 2021, 41(11): 3456

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    Paper Information

    Category: Orginal Article

    Received: Oct. 28, 2020

    Accepted: --

    Published Online: Dec. 17, 2021

    The Author Email:

    DOI:10.3964/j.issn.1000-0593(2021)11-3456-06

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