High Power Laser Science and Engineering, Volume. 11, Issue 6, 06000e71(2023)

X-ray polarimetry and its application to strong-field quantum electrodynamics

Qiqi Yu1,2, Dirui Xu3, Baifei Shen1、*, Thomas E. Cowan2,4, and Hans-Peter Schlenvoigt2、*
Author Affiliations
  • 1Shanghai Normal University, Shanghai, China
  • 2Helmholtz-Zentrum Dresden – Rossendorf, Dresden, Germany
  • 3State Key Laboratory of High Field Laser Physics, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai, China
  • 4Technische Universität Dresden, Dresden, Germany
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    Figures & Tables(23)
    Basic scheme of polarimetry. Essential is the pair of polarizers with different and variable orientations to each other to study the effect of a sample in between on the polarization.
    Basic diffraction geometry for anomalous transmission of X-rays (Borrmann effect). Reprinted from Ref. [45], with the permission of AIP Publishing.
    Geometry of the Bragg diffraction at 45°. Unpolarized radiation is polarized because the -component, being in the plane of incidence, is not allowed for reflection (Brewster’s law). Used with the permission of SPIE, from Ref. [50]; permission conveyed through Copyright Clearance Center, Inc.
    Kossel pattern of silicon at 12.914 keV. The bold black circle represents the exploited Si (800) reflection used for suppression of the component. All other possible reflections are depicted by thin colored circles. The vectors and describe the direction of the incident and diffracted wave, respectively. In order to avoid degradation of the polarization purity due to multiple-beam cases, the azimuth has to be chosen such that the ‘distance’ to the closest undesired reflections is as large as possible. Reprinted from Ref. [51], with the permission of APS.
    Reflectivity of X-rays for the –polarization in 45° symmetric Bragg scattering geometry as a function of the angle of incidence, according to dynamical theory calculations. Solid line: the (400) Bragg reflection in diamond for 9.831 keV. Dashed line: the (400) Bragg reflection in silicon for 6.457 keV, as used by Marx et al.[51" target="_self" style="display: inline;">51]. Note that . Reprinted from Ref. [53], with the permission of AIP Publishing.
    Schematic of a channel-cut polarizer with reflections. Thin lines indicate the lattice planes for the 45° Bragg reflection, which are parallel to the surface in this case.
    Polarization ratios for m-fold multiple Bragg reflection polarizers using the Ge (440) Bragg reflection. Reprinted from Ref. [54], with the permission of Taylor & Francis.
    The geometry for an asymmetrically cut channel-cut crystal with a Bragg angle near 45°. The lattice planes, as indicated in Figure 6, are oriented 45° to the beam, yet the crystal surface is slanted. The asymmetry angle is the angle between surface and lattice planes. It is negative for the case shown at the first surface where the incident beam is shallow and leaves with a larger diameter.
    The effect of an asymmetric cutting angle on both the angular acceptance and the resulting polarization suppression for a silicon (840) channel-cut crystal. Reprinted from Ref. [67], with the permission of AIP Publishing.
    Proposed experimental setup for the demonstration of vacuum birefringence: a high-intensity laser pulse is focused by an F/2.5 off-axis parabolic mirror. A hole is drilled into the parabolic mirror in alignment with the z-axis (axes as indicated) in such a way that an X-ray pulse can propagate along the z-axis through the focal region of the high-intensity laser pulse. Using a polarizer–analyzer pair, the ellipticity of the X-ray pulse may be detected. Shown in grey: extension of the setup for the generation of counter-propagating laser pulses and a high-intensity standing wave, which may be used for pair creation. Reprinted from Ref. [20], with the permission of Elsevier.
    Schematic views of the experimental setup. Top: several meter-long parts of the X-ray beamline centered around the interaction point with the optical components inside a vacuum chamber. Left: zoom into a cm-sized neighborhood of the focus where the cleaning electrodes will be placed. Bottom left: another zoom into the cleaned region. The focus of the cleaning laser is about 10 μm wide. However, only a fraction (pink) of the cleaned region will be employed as the interaction region, where the PW optical laser () and the XFEL beam () are focused and superimposed. Bottom right: fundamental idea of probing QED vacuum birefringence caused by an intense optical laser with the XFEL beam. Beams are counter-propagating with their foci overlapping in space and time. To maximize the effect, the polarization directions must differ by 45°. A slight ellipticity in the polarization of the out-going probe pulse will occur. Used with the permission of IOP Publishing, from Ref. [19]; permission conveyed through Copyright Clearance Center, Inc.
    Illustration of the experimental setup utilizing compound refractive lenses (CRLs) to focus and re-collimate the XFEL beam. Reflections at diamond crystals change the propagation direction, and a pair of diamond quasi-channel-cuts serve as the polarizer and analyzer, respectively. The original XFEL beam is focused with a CRL to constitute the pump field; the beam focus defines the interaction point. Subsequently, it is defocused with a CRL and by reflection at two diamond crystals directed back to the interaction point under an angle of . Before reaching the interaction point, it is polarized with a diamond polarizer and the resulting probe beam focused to the interaction point with a CRL. Finally, it is defocused with another CRL, analyzed with a diamond analyzer and the signal registered with a charge-coupled device. Taken from Ref. [86], licensed under CC BY 4.0.
    Sketch of the experimental setup investigating CRL material properties. The multilayer mirrors collimate the X-rays from the rotating anode X-ray source. The combination of the polarizer, analyzer and charge-coupled device camera allows for polarization sensitive imaging. Reprinted from Ref. [61], with the permission of AIP Publishing.
    Schematic setup for nuclear resonant scattering with the polarization filtering method. The incoming radiation from the left is polarized by the first channel-cut crystal. Subsequently, the beam impinges on the magnetically anisotropic sample under investigation. The green arrow indicates the direction of the external magnetic field that induces optical activity via X-ray magnetic linear dichroism. The analyzer crystal in the crossed setting transmits only the photons that have undergone nuclear resonant - to –scattering. Taken from Ref. [68], licensed under CC BY 4.0.
    An illustrated experimental setup of strong magnetic field generation by interaction of an ultra-short relativistic optical laser pulse with solid matter, probed by an XFEL via Faraday rotation. Taken from Ref. [140], licensed under CC BY 4.0.
    Exploded view of the OSO-8 polarimeter assemblies. The crystal reflector employs approximately Bragg angle and is thereby polarization-filtering. Reprinted from Ref. [151], with the permission of Springer Nature.
    • Table 1. Comparison of measured purity against the calculated limit given by the beam divergence for . Taken from Ref. [55], licensed under CC BY 4.0.

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      Table 1. Comparison of measured purity against the calculated limit given by the beam divergence for . Taken from Ref. [55], licensed under CC BY 4.0.

      ${\sigma}_{\mathrm{H}}$ ${\mathcal{P}}_{\mathrm{exp}}$ ${\mathcal{P}}_{\mathrm{Divergence}}^{\mathrm{Limit}}$
      17 μrad $\left(3.3\pm 0.7\right)\times {10}^{-10}$ $3.2\times {10}^{-10}$
      14 μrad $\left(2.2\pm 0.9\right)\times {10}^{-10}$ $2.3\times {10}^{-10}$
      8.4 μrad $\left(1.4\pm 0.5\right)\times {10}^{-10}$ $1.1\times {10}^{-10}$
    • Table 2. Calculated polarization purity for asymmetry angle and number of reflections . Here, is the accepted beam divergence, is the beam footprint on the crystal surface and is the peak reflectivity. Taken from Ref. [68], licensed under CC BY 4.0.

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      Table 2. Calculated polarization purity for asymmetry angle and number of reflections . Here, is the accepted beam divergence, is the beam footprint on the crystal surface and is the peak reflectivity. Taken from Ref. [68], licensed under CC BY 4.0.

      ${\alpha}_{\mathrm{c}}\left({}^{\circ}\right)$ $n$ ${D}_{-}\left(\unicode{x3bc} \mathrm{rad}\right)$ ${S}_{+}\left(\mathrm{mm}\right)$ $I/{I}_0$ $\mathcal{P}$
      011.92.50.95 $1.1\times {10}^{-4}$
      021.92.50.90 $1.6\times {10}^{-7}$
      041.92.50.81 $5.4\times {10}^{-13}$
      –2813.48.10.93 $9.2\times {10}^{-5}$
      –2823.48.10.87 $1.1\times {10}^{-7}$
      –2843.48.10.76 $2.5\times {10}^{-13}$
      –4319.968.10.83 $4.5\times {10}^{-5}$
      –4329.968.10.68 $1.1\times {10}^{-8}$
    • Table 3. Overview of XFEL facilities. Bold facility names indicate facilities with an ultra-intense laser in operation. Italic represents planned facilities. Adapted from Ref. [90], licensed under CC BY-NC-ND 4.0.

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      Table 3. Overview of XFEL facilities. Bold facility names indicate facilities with an ultra-intense laser in operation. Italic represents planned facilities. Adapted from Ref. [90], licensed under CC BY-NC-ND 4.0.

      FacilitySoft/hardBeam energyPhoton energyRepetition rate
      FLASHSoft0.35–1.25 GeV14–620 keV4 kHz–1 MHz
      LCLSBoth2.5–16.9 GeV0.28–28.8 keV120 Hz
      SACLAHard5.1–8.5 GeV4–20 keV60 Hz
      FERMISoft1–1.5 GeV20–310 eV50 Hz
      PAL-XFELBoth3.5–10 GeV0.28–20 keV60 Hz
      SwissFELSoft2.1–5.8 GeV250–1240 keV100 Hz
      European XFELBoth8.5–17.5 GeV0.24–25 keV27 kHz
      SXFELSoft1–1.6 GeV124–1000 eV50 Hz
      LCLS-II (HE)Both4–15 GeV0.2–25 keV120 Hz, 1 MHz
      SHINEBoth8 GeV0.4–25 keV1 MHz
    • Table 4. Comparison of laser parameters and expected ellipticity (for 13 keV photon energy) of the proposed experiments. Note that Heinzl et al.[20] did not compute the effects of pulse duration and beam shapes, leading to a relatively large ellipticity.

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      Table 4. Comparison of laser parameters and expected ellipticity (for 13 keV photon energy) of the proposed experiments. Note that Heinzl et al.[20] did not compute the effects of pulse duration and beam shapes, leading to a relatively large ellipticity.

      ReferenceLaser powerIntensityEllipticity
      (PW)(W/cm2)
      Heinzl et al.[20]1 $1\times {10}^{22}$ $5\times {10}^{-11}$
      Schlenvoigt et al.[19]1 $2\times {10}^{22}$ $4\times {10}^{-12}$
      Shen et al.[35]100 $2\times {10}^{23}$ $2\times {10}^{-10}$
      Mosman and Karbstein[85]0.3 $2\times {10}^{21}$ $4\times {10}^{-13}$
    • Table 5. Timeline of precision X-ray polarimetry. Here, denotes the number of reflections per channel-cut crystal, and represent the beam divergence, is the obtained polarization purity and is calculated from the divergence according to Equation (7). For the current record[72], the nominal instrument’s beam divergence was reduced by slits at the polarimeter.

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      Table 5. Timeline of precision X-ray polarimetry. Here, denotes the number of reflections per channel-cut crystal, and represent the beam divergence, is the obtained polarization purity and is calculated from the divergence according to Equation (7). For the current record[72], the nominal instrument’s beam divergence was reduced by slits at the polarimeter.

      2011[58]2013[51]2015[60]2016[53]2020[55]2021[68]2022[59]2022[72]
      FacilityESRFESRFPetra IIIESRFESRFPetra IIIEu. XFELPetra III
      BeamlineID06ID06P01ID06ID18P01HEDP01
      ${E}_{\mathrm{ph}}$ (keV)6.4576.45712.9149.8399.8314.416.45712.914
      MaterialSiliconSiliconSiliconDiamondDiamondSiliconSiliconSilicon
      Reflection(400)(400)(800)(400)(400)(840)(400)(800)
      $m$ 46624464
      ${\alpha}_{\mathrm{c}}$ 00000 $-28{}^{\circ}$ 00
      ${\sigma}_{\mathrm{H}}$ (μrad)-10.3-108.4-0.27318.8
      ${\sigma}_{\mathrm{V}}$ (μrad)-2.9--6.1- $\approx 0$ 25.9
      $\mathcal{P}$ $1.5\times {10}^{-9}$ $2.3\times {10}^{-10}$ $2\times {10}^{-9}$ $8.9\times {10}^{-10}$ $1.1\times {10}^{-10}$ $2.2\times {10}^{-9}$ $8\times {10}^{-11}$ $1.4\times {10}^{-11}$
      ${\mathcal{P}}_{\mathrm{Divergence}}^{\mathrm{Limit}}$ - $1.2\times {10}^{-10}$ - $1.0\times {10}^{-10}$ $1.1\times {10}^{-10}$ - $7.5\times {10}^{-14}$ $<{10}^{-9}$
    • Table 6. Overview of facilities combining XFEL beams with PW-class lasers. Planned facilities are shown in italic. Please note that there is no common factorial relation between laser power and peak intensity. Focusing F-numbers very among the facilities, adapted to their overall mission. Furthermore, beam quality can reduce the encircled energy in the focal spot and therefore reduce the peak intensity[127]. The provided laser pulse wavefront control for the final focusing and reasonably tight focusing, per 1 PW, is realistic.

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      Table 6. Overview of facilities combining XFEL beams with PW-class lasers. Planned facilities are shown in italic. Please note that there is no common factorial relation between laser power and peak intensity. Focusing F-numbers very among the facilities, adapted to their overall mission. Furthermore, beam quality can reduce the encircled energy in the focal spot and therefore reduce the peak intensity[127]. The provided laser pulse wavefront control for the final focusing and reasonably tight focusing, per 1 PW, is realistic.

      FacilityEnd station ${E}_{\mathrm{BG}}$ ${\tau}_{\mathrm{BG}}$ ${P}_{\mathrm{BG}}$ ${I}_{\mathrm{BG}}$
      LCLSMEC[125]1 J40 fs25 TW $\le {10}^{20}\ \mathrm{W}/{\mathrm{cm}}^2$
      LCLS-II(-HE)MEC-U[126]150 J150 fs1 PW $>{10}^{21}\ \mathrm{W}/{\mathrm{cm}}^2$
      European XFELHED[128,129]10 J30 fs300 TW $\le {10}^{22}\ \mathrm{W}/{\mathrm{cm}}^2$
      SACLAEH6[127]2 × 12.5 J30 fs2 × 500 TW $\le {10}^{21}\ \mathrm{W}/{\mathrm{cm}}^2$
      SHINESEL[35]1500 J15 fs $100\;\mathrm{PW}$ $>{10}^{23}\ \mathrm{W}/{\mathrm{cm}}^2$
    • Table 7. Deterioration of polarization purity by CRL materials. Upper part for flat Be samples at approximately 8 keV; lower part for CRL telescopes with focal length at approximately 13 keV. Data taken from Ref. [61], with the permission of AIP Publishing, and from Ref. [72], licensed under CC BY 4.0.

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      Table 7. Deterioration of polarization purity by CRL materials. Upper part for flat Be samples at approximately 8 keV; lower part for CRL telescopes with focal length at approximately 13 keV. Data taken from Ref. [61], with the permission of AIP Publishing, and from Ref. [72], licensed under CC BY 4.0.

      SampleThickness (μm)Polarization purity
      No sample- $8\times {10}^{-8}$
      Be PF-60500 $9\times {10}^{-6}$
      Be IF-1500 $6\times {10}^{-6}$
      Be O-30-H700 $4\times {10}^{-6}$
      CRL materialTransmissionPolarization purity
      No lenses- $\left(1.4\pm 0.9\right)\times {10}^{-11}$
      Be O-30-H0.93 $\left(6.9\pm 0.2\right)\times {10}^{-9}$
      SU-80.64 $\left(3.3\pm 1.5\right)\times {10}^{-11}$
      Diamond0.82 $\left(3.1\pm 0.7\right)\times {10}^{-10}$
      Glassy carbon0.63 $\left(1.9\pm 0.1\right)\times {10}^{-9}$
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    Qiqi Yu, Dirui Xu, Baifei Shen, Thomas E. Cowan, Hans-Peter Schlenvoigt. X-ray polarimetry and its application to strong-field quantum electrodynamics[J]. High Power Laser Science and Engineering, 2023, 11(6): 06000e71

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    Paper Information

    Category:

    Received: Feb. 16, 2023

    Accepted: May. 22, 2023

    Published Online: Oct. 31, 2023

    The Author Email: Baifei Shen (bfshen@shnu.edu.cn), Hans-Peter Schlenvoigt (h.schlenvoigt@hzdr.de)

    DOI:10.1017/hpl.2023.45

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