Laser & Optoelectronics Progress, Volume. 60, Issue 2, 0222001(2023)

Scintillation Noise Test System of Image Intensifier Based on CMOS Image Sensor

Minjie Yang, Yunsheng Qian*, Yiyun Yan, and Sheng Wu
Author Affiliations
  • School of Electronic and Optical Engineering, Nanjing University of Science & Technology, Nanjing 210094, Jiangsu , China
  • show less
    Figures & Tables(8)
    Block diagram of scintillation noise comprehensive test system
    Overall logical framework diagram
    Software interface of upper computer
    Binarization and connected domain detection results
    Thermal diagrams of discrete coefficient under different illuminance . (a) Illuminance is 5×10-7 lx; (b) illuminance is 7×10-6 lx;(c) illuminance is 1.2×10-6 lx; (d) illuminance is 2.8×10-6 lx; (e) illuminance is 6.37×10-6 lx; (f) illuminance is 1.34×10-5 lx
    Discrete coefficient thermal maps of different image intensifiers
    • Table 1. Parameters of image intensifier to be measured

      View table

      Table 1. Parameters of image intensifier to be measured

      ModelGainEquivalent background illumination /(10-6 lx)SNR
      101180.323.4
      98790.2128.6
      142630.1525.7
    • Table 2. The average amount of highlight noise obtained by image intensifier when the threshold value of binarization is 100

      View table

      Table 2. The average amount of highlight noise obtained by image intensifier when the threshold value of binarization is 100

      Model12345Mean
      5.165.225.085.175.255.18
      1.481.421.361.391.391.40
      0.840.860.880.880.830.86
    Tools

    Get Citation

    Copy Citation Text

    Minjie Yang, Yunsheng Qian, Yiyun Yan, Sheng Wu. Scintillation Noise Test System of Image Intensifier Based on CMOS Image Sensor[J]. Laser & Optoelectronics Progress, 2023, 60(2): 0222001

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Save article for my favorites
    Paper Information

    Category: Optical Design and Fabrication

    Received: Sep. 15, 2021

    Accepted: Nov. 10, 2021

    Published Online: Jan. 6, 2023

    The Author Email: Yunsheng Qian (yshqian2015@163.com)

    DOI:10.3788/LOP212537

    Topics