Opto-Electronic Engineering, Volume. 44, Issue 10, 1025(2017)

Measurement of cryogenic thermal expansion coefficient and accuracy analysis

Lei Ni, Baorui Huang, and Peilin Li
Author Affiliations
  • Key Laboratory of Testing Technology for Manufacturing Process, Southwest University of Science and Technology, Mianyang 621010, China
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    Lei Ni, Baorui Huang, Peilin Li. Measurement of cryogenic thermal expansion coefficient and accuracy analysis[J]. Opto-Electronic Engineering, 2017, 44(10): 1025

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    Received: --

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    Published Online: Nov. 27, 2017

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    CSTR:32186.14.

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