Acta Optica Sinica, Volume. 45, Issue 4, 0415001(2025)
Inspection Method for Aesthetic Defects in Polarizers Based on Polarimetry Basis Parameters
Fig. 2. Distribution of 5 PBPs in polarized film sample. (a) Scratch defect; (b) bubble defect; (c) indentation defect; (d) no defect
Fig. 3. PBPs images of scratches, bubbles, indentations, and non-defective samples (PBPs from left to right are b, D,
Fig. 6. Comparison of PSA and PBPI images with defects. (a1)(a2) Scratch defects; (b1)(b2) bubble defects; (c1)(c2) indentation defects; (d1)(d2) protuberance defects
Fig. 8. Image generation results (two columns on left: actual and synthesized PSA images; two columns on right: actual and synthesized PBPI images). (a) Scratch defects; (b) bubble defects; (c) indentation defects; (d) no defect
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Junwei Zhu, Yuanlong Deng, Xuan Zhou, Shaolong Chen, Xiaopin Zhong, Xingzheng Wang. Inspection Method for Aesthetic Defects in Polarizers Based on Polarimetry Basis Parameters[J]. Acta Optica Sinica, 2025, 45(4): 0415001
Category: Machine Vision
Received: Sep. 23, 2024
Accepted: Dec. 11, 2024
Published Online: Feb. 20, 2025
The Author Email: Yuanlong Deng (dengyl@szu.edu.cn)
CSTR:32393.14.AOS241584