Fig. 1. Time- and frequency-domain THz signals of a 470-µm-thick monocrystalline Si sample. (a) Time-domain THz signal of the 470-µm-thick monocrystalline Si sample and the sample-less reference signal. The magnified inset shows the three echoes that were generated by the F-P effect. (b) Frequency spectra of the 470-µm-thick monocrystalline Si sample, reference signal, and noise in the THz band.

Fig. 2. Refractive indices and extinction coefficients of the Si sample. Comparison in terms of (a) refractive indices and (b) extinction coefficients.

Fig. 3. Refractive indices and extinction coefficients of the Si sample at 2–2.5 THz frequencies. Comparison in terms of (a) refractive indices and (b) extinction coefficients.

Fig. 4. THz transmission spectra of the two PC samples and the sample-less condition.

Fig. 5. Comparison between refractive indices and extinction coefficients computed by the proposed and iterative frequency-domain methods for two PC materials with different thicknesses. Comparison in terms of (a) refractive indices and (b) extinction coefficients.